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"liu c w"的相關文件
顯示項目 1176-1185 / 1255 (共126頁)
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| 國立臺灣大學 |
2002 |
Roughness- Enhanced Reliability of MOS Tunneling Diodes
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Lin, C.-H.; Yuan, F.; Shie, C.-R.; Chen, K.-F.; Hsu, B.-C.; Lee, M.H.; Pai, W.W.; Liu, C.W. |
| 國立臺灣大學 |
2002 |
Oxide roughness effect on tunneling current of MOS diodes
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Hsu, B.-C.; Chen, K.-F.; Lai, C.-C.; Lee, S.W.; Liu, C.W. |
| 國立臺灣大學 |
2001-12 |
Novel photodetectors using metal-oxide-silicon tunneling structures
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Hsu, B.C.; Liu, W.T.; Lin, C.H.; Liu, C.W. |
| 國立臺灣大學 |
2001-12 |
Oxide roughness enhanced reliability of MOS tunneling diodes
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Lin, C.H.; Lee, M.H.; Hsu, B.C.; Chen, K.F.; Shie, C.R.; Liu, C.W. |
| 國立臺灣大學 |
2001-12 |
Effect of recombination lifetime and velocity saturation on Ge profile design for the base transit time of Si/SiGe HBTs
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Chang, S.T.; Liu, C.W.; Lu, S.C. |
| 國立臺灣大學 |
2001-12 |
Optimum Ge profile design for base transit time minimization of SiGe HBT
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Chang, S.T.; Liu, C.W.; Lin, C.H. |
| 國立成功大學 |
2001-11 |
Characterization and reliability of low dielectric constant fluorosilicate glass and silicon rich oxide process for deep sub-micron device application
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Cheng, Y. L.; Wang, Ying-Lang; Liu, C. W.; Wu, Y. L.; Lo, Kuang-Yao; Liu, Chuan-Pu; Lan, J. K. |
| 國立成功大學 |
2001-11 |
Integration of MOCVD titanium nitride with collimated titanium and ion metal plasma titanium for 0.18-mu m logic process
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Lan, J. K.; Wang, Ying-Lang; Lo, Kuang-Yao; Liu, Chuan-Pu; Liu, C. W.; Wang, JK; Cheng, Y. L.; Chau, C. G. |
| 淡江大學 |
2001-11 |
Application of SOM-Based Fuzzy Systems in Voltage Security Margin Estimation
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Su, M.C.; Lai, Eugene; Tew, C.Y.; Liu, C.W.; Chang, C.S. |
| 輔英科技大學 |
2001-09-01 |
Simulation of Ventilation and Fire in the Underground Facilities
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Cheng, L.H.; Liu, C.W. ; Ueng, T.H. |
顯示項目 1176-1185 / 1255 (共126頁)
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