|
"liu c w"的相關文件
顯示項目 701-710 / 1255 (共126頁)
<< < 66 67 68 69 70 71 72 73 74 75 > >>
每頁顯示[10|25|50]項目
| 臺大學術典藏 |
2018-09-10T07:05:07Z |
Acute toxicity and bioaccumulation of arsenic in freshwater clam Corbicula fluminea
|
Liao, C.-M.; Liao, Chung-Minet al.; CHEN-WUING LIU; VIVIAN LIAO; Chang, Fi-John; Jau, S.-F.; Chen, W.-Y.; Lin, C.-M.; Jou, L.-J.; Liu, C.-W.; Liao, V.H.-C.; Chang, F.-J.Liao, Chung-Min; Jau, Sheng-Feng; Chen, Wei-Yu; Lin, Chieh-Ming; Jou, Li-John; Liu, Chen-Wuing; Vivian Liao, Hsiu-Chuan; Chang, Fi-John |
| 臺大學術典藏 |
2018-09-10T07:04:12Z |
RTP temperature measurements using Si grating prepared by laser ablation for large diameter wafer applications
|
Liu, C.W.; Lee, M.H.; Chao, C.Y.; Chen, C.Y.; Yang, C.C.; Chang, Y.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T07:04:11Z |
Fano interference in the quantum wellquantum dot system
|
Abramov, A.A.; Lin, C.-H.; Liu, C.W.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T07:04:11Z |
Digital communication using Ge metal-insulator-semiconductor light-emitting diodes and photodetectors
|
Cheng, T.-H.; Liao, M.H.; Yeh, L.; Lee, T.-L.; Liang, M.-S.; Liu, C.W.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T07:04:11Z |
Comprehensive study of bias temperature instability on polycrystalline silicon thin-film transistors
|
Huang, C.-F.; Chen, Y.-T.; Sun, H.-C.; Liu, C.W.; Hsu, Y.-C.; Shih, C.-C.; Lin, K.-C.; Chen, J.-S.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T07:04:11Z |
A new NBTI characterization method on polycrystalline silicon thin-film transistors
|
Chen, Y.-T.; Liu, C.W.; Hsu, Y.-C.; Shih, C.-C.; Chen, J.-S.; CHEE-WEE LIU; Sun, H.-C.; Huang, C.-F. |
| 臺大學術典藏 |
2018-09-10T07:04:11Z |
Valence band properties of relaxed Ge1-xCx alloys
|
Lin, C.Y.; Liu, C.W.; Lee, L.J.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T07:04:10Z |
Micro-Raman studies on nickel germanides formed on (110) crystalline Ge
|
Peng, C.-Y.; Huang, C.-F.; Yang, Y.-J.; Liu, C.W.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T07:04:10Z |
Logic 90 nm n-channel field effect transistor current and speed enhancements through external mechanical package straining
|
Liao, W.-S.; Huang, S.-Y.; Tang, M.-C.; Liaw, Y.-G.; Chen, K.-M.; Shih, T.; Tsen, H.-C.; Chung, L.; Liu, C.W.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T07:04:10Z |
Investigation of reliability characteristics in NMOS and PMOS FinFETs
|
Liao, W.-S.; Liaw, Y.-G.; Tang, M.-C.; Chakraborty, S.; Liu, C.W.; CHEE-WEE LIU |
顯示項目 701-710 / 1255 (共126頁)
<< < 66 67 68 69 70 71 72 73 74 75 > >>
每頁顯示[10|25|50]項目
|
