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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立臺灣大學 2003 A High Efficient 820 nm MOS Ge Quantum Dot Photodetector Hsu, B.-C.; Chang, S.T.; Chen, T.-C.; Kuo, P.-S.; Chen, P.S.; Pei, Z.; Liu, C.W.
國立臺灣大學 2003 A High-Performance SiGe-Si Multiple-Quantum-Well Heterojunction Phototransistor Pei, Zingway; Liang, C.S.; Lai, L.S.; Tseng, Y.T.; Hsu, Y.M.; Chen, P.S.; Lu, S.C.; Tsai, M.-J.; Liu, C.W.
臺大學術典藏 2003 Enhancing electroluminescence from metal-oxide–silicon tunneling diodes by nano-structures of oxide grown by liquid-phase method Lin, Ching-Fuh; Su, Ting-Wien; Chung, Peng-Fei; Liang, Eih-Zhe; Chen, Miin-Jang; Liu, C. W.; Lin, Ching-Fuh; Su, Ting-Wien; Chung, Peng-Fei; Liang, Eih-Zhe; Chen, Miin-Jang; Liu, C. W.
臺大學術典藏 2003 Strain-induced growth of SiO2 dots by liquid phase deposition Shie, C.-R.; Chen, Pang-Shiu; LiuCW; Lee, M. H.; Chen, K.-F.; Hsu, B.-C.; Liu, C. W.; Liu, C. W.; Hsu, B.-C.; Chen, K.-F.; Lee, M. H.; Shie, C.-R.; Chen, Pang-Shiu
臺大學術典藏 2003 A New Algorithm for Monitoring Low Frequency Oscillation in Real Time Yang, J.-Z.; Liu, C.-W.; Wu, W.-G.; CHIH-WEN LIU
臺大學術典藏 2003 Closure on “A New Protection Scheme for Fault Detection, Direction Discrimination, Classification, and Location in Transmission Lines” Jiang J.-A.;Liu C.-W.; Jiang J.-A.; Liu C.-W.; JOE-AIR JIANG
臺大學術典藏 2003 Electroluminescence and photoluminescence studies on carrier radiative and nonradiative recombinations in metal-oxide-silicon tunneling diodes Liu, C. W.;Lin, Ching-Fuh;Liang, Eih-Zhe;Tsai, Chen S.;Yen, Jia-Liang;Chang, Jui-Fen;Chen, Miin-Jang;Liu, C. W.;Lin, Ching-Fuh;Liang, Eih-Zhe;Tsai, Chen S.;Yen, Jia-Liang;Chang, Jui-Fen;Chen, Miin-Jang;Liu, C. W.;Liang, Eih-Zhe;Tsai, Chen S.;Yen, Jia-Liang;Chang, Jui-Fen;Lin, Ching-Fuh;Chen, Miin-Jang; Chen, Miin-Jang; Chang, Jui-Fen; Yen, Jia-Liang; Tsai, Chen S.; Liang, Eih-Zhe; Lin, Ching-Fuh; Liu, C. W.; Chen, Miin-Jang; Chang, Jui-Fen; Yen, Jia-Liang; Tsai, Chen S.; Liang, Eih-Zhe; Lin, Ching-Fuh; Liu, C. W.
國立臺灣大學 2002-12 High efficient 820 nm MOS Ge quantum dot photodetectors for short-reach integrated optical receivers with 1300 and 1550 nm sensitivity Hsu, B.C.; Chang, S.T.; Shie, C.R.; Lai, C.C.; Chen, P.S.; Liu, C.W.
國立臺灣大學 2002-08 The band-edge light emission from the metal-oxide-silicon tunneling diode on (110) substrates Chang, S. T.; Chen, K.F.; Shie, C. R.; Liu, C. W.; Chen, Miin-Jang; Lin, Ching-Fuh
國立臺灣大學 2002-07 Self-correction two-machine equivalent model for stability control of FACT system using real-time phasor measurements Yu, C.S.; Liu, C.W.
國立臺灣大學 2002-03 The roughness-enhanced light emission from metal-oxide-silicon light-emitting diodes using very high vacuum prebake Lee, M. H.; Chen, K. F.; Lai, C. C.; Liu, C. W.; Pai, W. W.; Chen, Miin-Jang; Lin, Ching-Fuh
國立臺灣大學 2002 The band-edge light emission from the metal-oxide-silicon tunneling diode on (1 1 0) substrates Chang, S. T.; Chen, K. F.; Shie, C. R.; Liu, C. W.; Chen, Miin-Jang; Lin, Ching-Fuh
國立臺灣大學 2002 A new algorithm for available transfer capability computation Li, C. -Y.; Liu, C. -W.
國立臺灣大學 2002 Unit commitment by annealing-genetic algorithm Cheng, C. -P.; Liu, C. -W.; Liu, C. -C.
國立臺灣大學 2002 Energy band structure of strained Si1-xCx alloys on Si (001) substrate Chang, S. T.; Lin, C. Y.; Liu, C. W.
國立臺灣大學 2002 Roughness- Enhanced Reliability of MOS Tunneling Diodes Lin, C.-H.; Yuan, F.; Shie, C.-R.; Chen, K.-F.; Hsu, B.-C.; Lee, M.H.; Pai, W.W.; Liu, C.W.
國立臺灣大學 2002 Oxide roughness effect on tunneling current of MOS diodes Hsu, B.-C.; Chen, K.-F.; Lai, C.-C.; Lee, S.W.; Liu, C.W.
國立臺灣大學 2001-12 Novel photodetectors using metal-oxide-silicon tunneling structures Hsu, B.C.; Liu, W.T.; Lin, C.H.; Liu, C.W.
國立臺灣大學 2001-12 Oxide roughness enhanced reliability of MOS tunneling diodes Lin, C.H.; Lee, M.H.; Hsu, B.C.; Chen, K.F.; Shie, C.R.; Liu, C.W.
國立臺灣大學 2001-12 Effect of recombination lifetime and velocity saturation on Ge profile design for the base transit time of Si/SiGe HBTs Chang, S.T.; Liu, C.W.; Lu, S.C.
國立臺灣大學 2001-12 Optimum Ge profile design for base transit time minimization of SiGe HBT Chang, S.T.; Liu, C.W.; Lin, C.H.
國立成功大學 2001-11 Characterization and reliability of low dielectric constant fluorosilicate glass and silicon rich oxide process for deep sub-micron device application Cheng, Y. L.; Wang, Ying-Lang; Liu, C. W.; Wu, Y. L.; Lo, Kuang-Yao; Liu, Chuan-Pu; Lan, J. K.
國立成功大學 2001-11 Integration of MOCVD titanium nitride with collimated titanium and ion metal plasma titanium for 0.18-mu m logic process Lan, J. K.; Wang, Ying-Lang; Lo, Kuang-Yao; Liu, Chuan-Pu; Liu, C. W.; Wang, JK; Cheng, Y. L.; Chau, C. G.
淡江大學 2001-11 Application of SOM-Based Fuzzy Systems in Voltage Security Margin Estimation Su, M.C.; Lai, Eugene; Tew, C.Y.; Liu, C.W.; Chang, C.S.
輔英科技大學 2001-09-01 Simulation of Ventilation and Fire in the Underground Facilities Cheng, L.H.; Liu, C.W. ; Ueng, T.H.

Showing items 1161-1185 of 1255  (51 Page(s) Totally)
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