|
|
Taiwan Academic Institutional Repository >
Browse by Author
|
"liu c w"
Showing items 1171-1180 of 1255 (126 Page(s) Totally)
<< < 113 114 115 116 117 118 119 120 121 122 > >>
View [10|25|50] records per page
| 國立臺灣大學 |
2002-03 |
The roughness-enhanced light emission from metal-oxide-silicon light-emitting diodes using very high vacuum prebake
|
Lee, M. H.; Chen, K. F.; Lai, C. C.; Liu, C. W.; Pai, W. W.; Chen, Miin-Jang; Lin, Ching-Fuh |
| 國立臺灣大學 |
2002 |
The band-edge light emission from the metal-oxide-silicon tunneling diode on (1 1 0) substrates
|
Chang, S. T.; Chen, K. F.; Shie, C. R.; Liu, C. W.; Chen, Miin-Jang; Lin, Ching-Fuh |
| 國立臺灣大學 |
2002 |
A new algorithm for available transfer capability computation
|
Li, C. -Y.; Liu, C. -W. |
| 國立臺灣大學 |
2002 |
Unit commitment by annealing-genetic algorithm
|
Cheng, C. -P.; Liu, C. -W.; Liu, C. -C. |
| 國立臺灣大學 |
2002 |
Energy band structure of strained Si1-xCx alloys on Si (001) substrate
|
Chang, S. T.; Lin, C. Y.; Liu, C. W. |
| 國立臺灣大學 |
2002 |
Roughness- Enhanced Reliability of MOS Tunneling Diodes
|
Lin, C.-H.; Yuan, F.; Shie, C.-R.; Chen, K.-F.; Hsu, B.-C.; Lee, M.H.; Pai, W.W.; Liu, C.W. |
| 國立臺灣大學 |
2002 |
Oxide roughness effect on tunneling current of MOS diodes
|
Hsu, B.-C.; Chen, K.-F.; Lai, C.-C.; Lee, S.W.; Liu, C.W. |
| 國立臺灣大學 |
2001-12 |
Novel photodetectors using metal-oxide-silicon tunneling structures
|
Hsu, B.C.; Liu, W.T.; Lin, C.H.; Liu, C.W. |
| 國立臺灣大學 |
2001-12 |
Oxide roughness enhanced reliability of MOS tunneling diodes
|
Lin, C.H.; Lee, M.H.; Hsu, B.C.; Chen, K.F.; Shie, C.R.; Liu, C.W. |
| 國立臺灣大學 |
2001-12 |
Effect of recombination lifetime and velocity saturation on Ge profile design for the base transit time of Si/SiGe HBTs
|
Chang, S.T.; Liu, C.W.; Lu, S.C. |
Showing items 1171-1180 of 1255 (126 Page(s) Totally)
<< < 113 114 115 116 117 118 119 120 121 122 > >>
View [10|25|50] records per page
|
