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Showing items 886-895 of 1255 (126 Page(s) Totally)
<< < 84 85 86 87 88 89 90 91 92 93 > >>
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| 臺大學術典藏 |
2018-09-10T03:48:06Z |
A comprehensive study of inversion current in MOS tunneling diodes
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Lin, C.-H.; Hsu, B.-C.; Lee, M.H.; Liu, C.W.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T03:48:05Z |
Novel methods to incorporate deuterium in the MOS structures
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Lee, M.H.; Lin, C.-H.; Liu, C.W.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T03:48:05Z |
Improved optimal aim strategy based multiple TCSC controllers for transient stability control of interconnected power system
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Yu, C.-S.; Liu, C.-W.; Jiang, J.-A.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T03:48:05Z |
Correlation between Si-H/D bond desorption and injected electron energy in metal-oxide-silicon tunneling diodes
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Lin, C.-H.; Lee, M.H.; Liu, C.W.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T03:48:05Z |
An on-line fault estimation in distribution substations using improved cause-effect networks
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Chen, W.-H.; Liu, C.-W.; Tsai, M.-S.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T03:48:05Z |
Effect of recombination lifetime and velocity saturation on Ge profile design for the base transit time of Si/SiGe HBTs
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Chang, S.T.; Liu, C.W.; Lu, S.C.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T03:48:04Z |
Oxide roughness enhanced reliability of MOS tunneling diodes
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Lin, C.-H.; Lee, M.H.; Hsu, B.-C.; Chen, K.-F.; Shie, C.-R.; Liu, C.W.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T03:48:04Z |
Novel photodetectors using metal-oxide-silicon tunneling structures
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Hsu, B.-C.; Liu, W.T.; Lin, C.-H.; Liu, C.W.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T03:47:43Z |
Carrier lifetime measurement on electroluminescent metal-oxide-silicon tunneling diodes
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Chen, M.-J.; Lin, C.-F.; Lee, M.H.; Chang, S.T.; Liu, C.W.; CHING-FUH LIN; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T03:47:41Z |
Visible and band edge electroluminescence from indium tin oxide/SiO 2/Si metal-oxide-semiconductor structures
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Chen, M.-J.; Lin, C.-F.; Liu, W.T.; Chang, S.T.; Liu, C.W.; CHING-FUH LIN; CHEE-WEE LIU |
Showing items 886-895 of 1255 (126 Page(s) Totally)
<< < 84 85 86 87 88 89 90 91 92 93 > >>
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