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Institution	Date	Title	Author
東海大學	2011	Superior reliability of gate-all-around polycrystalline silicon thin-film transistors with vacuum cavities next to gate oxide edges	Liu, H.-W., Chiou, S.-M., Huang, H.-C., Gong, J., Wang, F.-H.

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	造訪人次 : 51968369 線上人數 : 909 教育部委託研究計畫計畫執行:國立臺灣大學圖書館