English  |  正體中文  |  简体中文  |  2826208  
???header.visitor??? :  31897442    ???header.onlineuser??? :  1156
???header.sponsordeclaration???
 
臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
???ui.leftmenu.abouttair???

???ui.leftmenu.bartitle???

???index.news???

???ui.leftmenu.copyrighttitle???

???ui.leftmenu.link???

"liu h w chiou s m huang h c go"???jsp.browse.items-by-author.description???

???jsp.browse.items-by-author.back???
???jsp.browse.items-by-author.order1??? ???jsp.browse.items-by-author.order2???

Showing items 1-1 of 1  (1 Page(s) Totally)
1 
View [10|25|50] records per page

Institution Date Title Author
東海大學 2011 Superior reliability of gate-all-around polycrystalline silicon thin-film transistors with vacuum cavities next to gate oxide edges Liu, H.-W., Chiou, S.-M., Huang, H.-C., Gong, J., Wang, F.-H.

Showing items 1-1 of 1  (1 Page(s) Totally)
1 
View [10|25|50] records per page