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Showing items 1-9 of 9 (1 Page(s) Totally)
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| 國立交通大學 |
2019-04-02T06:00:11Z |
Junction and Device Characteristics of Gate-Last Ge p- and n-MOSFETs With ALD-Al2O3 Gate Dielectric
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Cheng, Chao-Ching; Chien, Chao-Hsin; Luo, Guang-Li; Lin, Ching-Lun; Chen, Hung-Sen; Liu, Jun-Cheng; Kei, Chi-Chung; Hsiao, Chien-Nan; Chang, Chun-Yen |
| 國立政治大學 |
2019 |
有別於西歐的東亞經驗：臺灣移工政策設計的考察（1980-2016）
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劉濬誠; Liu, Jun-Cheng |
| 國立交通大學 |
2018-01-24T07:42:12Z |
Revit 於鋼筋混凝土結構建模實例探討
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劉俊成; 林昌佑; Liu, Jun-Cheng; Lin, Chang-Yu |
| 國立高雄應用科技大學 |
2017 |
磁共振暨磁感應之近場天線設計與實現
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劉俊呈; Liu, Jun-Cheng |
| 國立臺灣海洋大學 |
2017 |
蛋白質交互作用計算預測方法的成效評估
|
Liu, Jun-Cheng; 劉峻丞 |
| 國立交通大學 |
2014-12-08T15:12:50Z |
Characteristics of atomic-layer-deposited Al(2)O(3) high-k dielectric films grown on Ge substrates
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Cheng, Chao-Ching; Chien, Chao-Hsin; Luo, Guang-Li; Liu, Jun-Cheng; Kei, Chi-Chung; Liu, Da-Ren; Hsiao, Chien-Nan; Yang, Chun-Hui; Changa, Chun-Yen |
| 國立交通大學 |
2014-12-08T15:10:26Z |
Five-element circuit model using linear-regression method to correct the admittance measurement of metal-oxide-semiconductor capacitor
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Cheng, Chao-Ching; Chien, Chao-Hsin; Luo, Guang-Li; Liu, Jun-Cheng; Chen, Yi-Cheng; Chang, Yao-Feng; Wang, Shin-Yuan; Kei, Chi-Chung; Hsiao, Chien-Nan; Chang, Chun-Yen |
| 國立交通大學 |
2014-12-08T15:09:31Z |
Effects of Minority-Carrier Response Behavior on Ge MOS Capacitor Characteristics: Experimental Measurements and Theoretical Simulations
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Cheng, Chao-Ching; Chien, Chao-Hsin; Luo, Guang-Li; Ling, Yu-Ting; Chang, Ruey-Dar; Kei, Chi-Chung; Hsiao, Chien-Nan; Liu, Jun-Cheng; Chang, Chun-Yen |
| 國立交通大學 |
2014-12-08T15:09:00Z |
Junction and Device Characteristics of Gate-Last Ge p- and n-MOSFETs With ALD-Al(2)O(3) Gate Dielectric
|
Cheng, Chao-Ching; Chien, Chao-Hsin; Luo, Guang-Li; Lin, Ching-Lun; Chen, Hung-Sen; Liu, Jun-Cheng; Kei, Chi-Chung; Hsiao, Chien-Nan; Chang, Chun-Yen |
Showing items 1-9 of 9 (1 Page(s) Totally)
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