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Showing items 51-60 of 70  (7 Page(s) Totally)
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Institution Date Title Author
國立臺灣科技大學 2013 Fault scrambling techniques for yield enhancement of embedded memories Lu, S.-K.;Jheng, H.-C.;Hashizume, M.;Huang, J.-L.;Ning, P.
國立臺灣科技大學 2013 DFT for supply current testing to detect open defects at interconnects in 3D ICs Suenaga, S.;Hashizume, M.;Yotsuyanagi, H.;Lu, S.-K.;Roth, Z.
國立臺灣科技大學 2013 An efficient test and repair flow for yield enhancement of one-time-programming NROM-based ROMs Li, T.-L.;Hashizume, M.;Lu, S.-K.
國立臺灣科技大學 2013 Synergistic reliability and yield enhancement techniques for embedded SRAMs Lu, S.-K.;Huang, H.-H.;Huang, J.-L.;Ning, P.
國立臺灣科技大學 2012 Efficient built-in self-repair techniques for multiple repairable embedded RAMs Lu, S.-K.;Wang, Z.-Y.;Tsai, Y.-M.;Chen, J.-L.
國立臺灣科技大學 2012 Improving reusability of test symbols for test data compression Lu, S.-K.;Huang, Y.-C.
國立臺灣科技大學 2012 Scrambling and data inversion techniques for yield enhancement of NROM-Based ROMs Lu, S.-K.;Li, T.-L.;Ning, P.
國立臺灣科技大學 2012 On test and repair of 3D random access memory Wu, C.-W.; Lu, S.-K.; Li, J.-F.
國立臺灣科技大學 2012 Yield enhancement techniques for 3-dimensional random access memories Lu, S.-K.;Chang, T.-W.;Hsu, H.-Y.
國立臺灣科技大學 2011 Speeding Up Emulation-Based Diagnosis Techniques for Logic Cores Lu, S.K.;Chen, Y.M.;Huang, S.Y.;Wu, C.W.

Showing items 51-60 of 70  (7 Page(s) Totally)
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