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Institution Date Title Author
國立交通大學 2019-04-02T06:01:00Z Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process Characterization Luo, Tseng-Chin; Chao, Mango C. -T.; Tseng, Huan-Chi; Goto, Masaharu; Fisher, Philip A.; Chang, Yuan-Yao; Chang, Chi-Min; Takao, Takayuki; Iwasaki, Katsuhito; Lee, Cheng Mao
國立交通大學 2017-04-21T06:50:01Z Mask versus Schematic - An Enhanced Design-Verification Flow for First Silicon Success Luo, Tseng-Chin; Leong, Eric; Chao, Mango C-T; Fisher, Philip A.; Chang, Wen-Hsiang
國立交通大學 2017-04-21T06:49:33Z A novel array-based test methodology for local process variation monitoring Luo, Tseng-Chin; Chao, Mango C. -T.; Wu, Michael S. -Y.; Li, Kuo-Tsai; Hsia, Chin C.; Tseng, Huan-Chi; Huang, Chuen-Uan; Chang, Yuan-Yao; Pan, Samuel C.; Young, Konrad K. -L.
國立交通大學 2014-12-12T01:37:52Z EDA和測試方法之於先進CMOS製程技術變異的特性分析與降低化 羅增錦; Luo, Tseng-Chin; 趙家佐; Chao, Mango C.-T.
國立交通大學 2014-12-08T15:36:24Z Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process Characterization Luo, Tseng-Chin; Chao, Mango C. -T.; Tseng, Huan-Chi; Goto, Masaharu; Fisher, Philip A.; Chang, Yuan-Yao; Chang, Chi-Min; Takao, Takayuki; Iwasaki, Katsuhito; Lee, Cheng Mao
國立交通大學 2014-12-08T15:29:20Z A Novel Design Flow for Dummy Fill Using Boolean Mask Operations Luo, Tseng-Chin; Chao, Mango C. -T.; Fisher, Philip A.; Kuo, Chun-Ren
國立交通大學 2014-12-08T15:11:39Z A Novel Array-Based Test Methodology for Local Process Variation Monitoring Luo, Tseng-Chin; Chao, Mango C. -T.; Wu, Michael Shien-Yang; Li, Kuo-Tsai; Hsia, Chin C.; Tseng, Huan-Chi; Fisher, Philip A.; Huang, Chuen-Uan; Chang, Yuan-Yao; Pan, Samuel C.; Young, Konrad K. -L.
東吳大學 1997 中美專利審查基準中申請專利範圍之比較研究 駱增進; LUO, TSENG-CHIN

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