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| 國立交通大學 |
2019-04-02T06:01:00Z |
Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process Characterization
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Luo, Tseng-Chin; Chao, Mango C. -T.; Tseng, Huan-Chi; Goto, Masaharu; Fisher, Philip A.; Chang, Yuan-Yao; Chang, Chi-Min; Takao, Takayuki; Iwasaki, Katsuhito; Lee, Cheng Mao |
| 國立交通大學 |
2017-04-21T06:50:01Z |
Mask versus Schematic - An Enhanced Design-Verification Flow for First Silicon Success
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Luo, Tseng-Chin; Leong, Eric; Chao, Mango C-T; Fisher, Philip A.; Chang, Wen-Hsiang |
| 國立交通大學 |
2017-04-21T06:49:33Z |
A novel array-based test methodology for local process variation monitoring
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Luo, Tseng-Chin; Chao, Mango C. -T.; Wu, Michael S. -Y.; Li, Kuo-Tsai; Hsia, Chin C.; Tseng, Huan-Chi; Huang, Chuen-Uan; Chang, Yuan-Yao; Pan, Samuel C.; Young, Konrad K. -L. |
| 國立交通大學 |
2014-12-12T01:37:52Z |
EDA和測試方法之於先進CMOS製程技術變異的特性分析與降低化
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羅增錦; Luo, Tseng-Chin; 趙家佐; Chao, Mango C.-T. |
| 國立交通大學 |
2014-12-08T15:36:24Z |
Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process Characterization
|
Luo, Tseng-Chin; Chao, Mango C. -T.; Tseng, Huan-Chi; Goto, Masaharu; Fisher, Philip A.; Chang, Yuan-Yao; Chang, Chi-Min; Takao, Takayuki; Iwasaki, Katsuhito; Lee, Cheng Mao |
| 國立交通大學 |
2014-12-08T15:29:20Z |
A Novel Design Flow for Dummy Fill Using Boolean Mask Operations
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Luo, Tseng-Chin; Chao, Mango C. -T.; Fisher, Philip A.; Kuo, Chun-Ren |
| 國立交通大學 |
2014-12-08T15:11:39Z |
A Novel Array-Based Test Methodology for Local Process Variation Monitoring
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Luo, Tseng-Chin; Chao, Mango C. -T.; Wu, Michael Shien-Yang; Li, Kuo-Tsai; Hsia, Chin C.; Tseng, Huan-Chi; Fisher, Philip A.; Huang, Chuen-Uan; Chang, Yuan-Yao; Pan, Samuel C.; Young, Konrad K. -L. |
| 東吳大學 |
1997 |
中美專利審查基準中申請專利範圍之比較研究
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駱增進; LUO, TSENG-CHIN |
Showing items 1-8 of 8 (1 Page(s) Totally)
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