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"lynn d"的相關文件
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| 國立成功大學 |
2024-01-18 |
The persistent shadow of the supermassive black hole of M 87 I. Observations, calibration, imaging, and analysis
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Akiyama;Kazunori;Alberdi;Antxon;Alef;Walter;Algaba;Carlos, Juan;Anantua;Richard;Asada;Keiichi;Azulay;Rebecca;Bach;Uwe;Baczko;Anne-Kathrin;Ball;David;Balokovic;Mislav;Bandyopadhyay;Bidisha;Barrett;John;Baubock;Michi;Benson;Bradford, A.;Bintley;Dan;Blackburn;Lindy;Blundell;Raymond;Bouman;Katherine, L.;Bower;Geoffrey, C.;Boyce;Hope;Bremer;Michael;Brissenden;Roger;Britzen;Silke;Broderick;Avery, E.;Broguiere;Dominique;Bronzwaer;Thomas;Bustamante;Sandra;Carlstrom;John, E.;Chael;Andrew;Chan;Chi-Kwan;Chang;Dominic, O.;Chatterjee;Koushik;Chatterjee;Shami;Chen;Ming-Tang;Chen;Yongjun;Cheng;Xiaopeng;Cho;Ilje;Christian;Pierre;Conroy;Nicholas, S.;Conway;John, E.;Crawford;Thomas, M.;Crew;Geoffrey, B.;Cruz-Osorio;Alejandro;Cui;Yuzhu;Dahale;Rohan;Davelaar;Jordy;Laurentis, De;Mariafelicia;Deane;Roger;Dempsey;Jessica;Desvignes;Gregory;Dexter;Jason;Dhruv;Vedant;Dihingia;Indu, K.;Doeleman;Sheperd, Sheperd S.;Dzib;Sergio, A.;Eatough;Ralph, P.;Emami;Razieh;Falcke;Heino;Farah;Joseph;Fish;Vincent, L.;Fomalont;Edward;Ford;Alyson, H.;Foschi;Marianna;Fraga-Encinas;Raquel;Freeman;William, T.;Friberg;Per;Fromm;Christian, M.;Fuentes;Antonio;Galison;Peter;Gammie;Charles, F.;Garcia;Roberto;Gentaz;Olivier;Georgiev;Boris;Goddi;Ciriaco;Gold;Roman;Gomez-Ruiz;Arturo, I.;Gomez;Jose, L.;Gu;Minfeng;Gurwell;Mark;Hada;Kazuhiro;Haggard;Daryl;Hesper;Ronald;Heumann;Dirk;Ho;Luis, C.;Ho;Paul;Honma;Mareki;Huang;Chih-Wei, L.;Huang;Lei;Hughes;David, H.;Ikeda;Shiro;Impellizzeri;Violette, C. M.;Inoue;Makoto;Issaoun;Sara;James;David, J.;Jannuzi;Buell, T.;Janssen;Michael;Jeter;Britton;Jiang;Wu;Jimenez-Rosales;Alejandra;Johnson;Michael, D.;Jorstad;Svetlana;Jones;Adam, C.;Joshi;Abhishek, V.;Jung;Taehyun;Karuppusamy;Ramesh;Kawashima;Tomohisa;Keating;Garrett, K.;Kettenis;Mark;Kim;Dong-Jin;Kim;Jae-Young;Kim;Jongsoo;Kim;Junhan;Kino;Motoki;Koay;Yi, Jun;Kocherlakota;Prashant;Kofuji;Yutaro;Koch;Patrick, M.;Koyama;Shoko;Kramer;Carsten;Kramer;Joana, A.;Kramer;Michael;Krichbaum;Thomas, P.;Kuo;Cheng-Yu;Bella, La;Noemi;Lee;Sang-Sung;Levis;Aviad;Li;Zhiyuan;Lico;Rocco;Lindahl;Greg;Lindqvist;Michael;Lisakov;Mikhail;Liu;Jun;Liu;Kuo;Liuzzo;Elisabetta;Lo;Wen-Ping;Lobanov;Andrei, P.;Loinard;Laurent;Lonsdale;Colin, J.;Lowitz;Amy, E.;Lu;Ru-Sen;MacDonald;Nicholas, R.;Mao;Jirong;Marchili;Nicola;Markoff;Sera;Marrone;Daniel, P.;Marscher;Alan, P.;Marti-Vidal;Ivan;Matsushita;Satoki;Matthews;Lynn, D.;Medeiros;Lia;Menten;Karl, M.;Mizuno;Izumi;Mizuno;Yosuke;Montgomery;Joshua;Moran;James, M.;Moriyama;Kotaro;Moscibrodzka;Monika;Mulaudzi;Wanga;Mueller;Cornelia;Mueller;Hendrik;Mus;Alejandro;Musoke;Gibwa;Myserlis;Ioannis;Nagai;Hiroshi;Nagar;Neil, M.;Nakamura;Masanori;Narayanan;Gopal;Natarajan;Iniyan;Nathanail;Antonios;Fuentes;Navarro, Santiago;Neilsen;Joey;Ni;Chunchong;Nowak;Michael, A.;Oh;Junghwan;Okino;Hiroki;Olivares;Hector;Oyama;Tomoaki;Ozel;Feryal;Palumbo;Daniel, C. M.;Paraschos;Filippos, Georgios;Park;Jongho;Parsons;Harriet;Patel;Nimesh;Pen;Ue-Li;Pesce;Dominic, W.;Pietu;Vincent;PopStefanija;Aleksandar;Porth;Oliver;Prather;Ben;Psaltis;Dimitrios;Pu;Hung-Yi;Ramakrishnan;Venkatessh;Rao;Ramprasad;Rawlings;Mark, G.;Raymond;Alexander, W.;Rezzolla;Luciano;Ricarte;Angelo;Ripperda;Bart;Roelofs;Freek;Romero-Canizales;Cristina;Ros;Eduardo;Roshanineshat;Arash;Rottmann;Helge;Roy;Alan, L.;Ruiz;Ignacio;Ruszczyk;Chet;Rygl;Kazi, L. J.;Sanchez;Salvador;Sanchez-Arguelles;David;Sanchez-Portal;Miguel;Sasada;Mahito;Satapathy;Kaushik;Savolainen;Tuomas;Schloerb;Peter, F.;Schonfeld;Jonathan;Schuster;Karl-Friedrich;Shao;Lijing;Shen;Zhiqiang;Small;Des;Sohn;Won, Bong;SooHoo;Jason;Salas;Sosapanta, Leon David;Souccar;Kamal;Stanway;Joshua, S.;Sun;He;Tazaki;Fumie;Tetarenko;Alexandra, J.;Tiede;Paul;Tilanus;Remo, P. J.;Titus;Michael;Toma;Kenji;Torne;Pablo;Toscano;Teresa;Traianou;Efthalia;Trent;Tyler;Trippe;Sascha;Turk;Matthew;Bemmel, van;Ilse;Langevelde, van;Jan, Huib;Rossum, van;Daniel, R.;Vos;Jesse;Wagner;Jan;Ward-Thompson;Derek;Wardle;John;Washington;Jasmin, E.;Weintroub;Jonathan;Wharton;Robert;Wielgus;Maciek;Wiik;Kaj;Witzel;Gunther;Wondrak;Michael, F.;Wong;George, N.;Wu;Qingwen;Yadlapalli;Nitika;Yamaguchi;Paul;Yfantis;Aristomenis;Yoon;Doosoo;Young;Andre;Younsi;Ziri;Yu;Wei;Yuan;Feng;Yuan;Ye-Fei;Zensus;Anton, J.;Zhang;Shuo;Zhao;Guang-Yao;Zhao;Shan-Shan;Allardi;Alexander;Chang;Shu-Hao;Chang;Chih-Cheng;Chang;Song-Chu;Chen;Chung-Chen;Chilson;Ryan;Faber;Aaron;Gale;David, M.;Han;Chih-Chiang;Han;Kuo-Chang;Hasegawa;Yutaka;Hernandez-Rebollar;Luis, Jose;Huang;Yau-De;Jiang;Homin;Jinchi;Hao;Kimura;Kimihiro;Kubo;Derek;Li;Chao-Te;Lin;Lupin, C. -C.;Liu;Ching-Tang;Liu;Kuan-Yu;Lu;Li-Ming;Martin-Cocher;Pierre;Meyer-Zhao;Zheng;Montana;Alfredo;Moraghan;Anthony;Moreno-Nolasco;Emir, Marcos;Nishioka;Hiroaki;Norton;Timothy, J.;Nystrom;George;Ogawa;Hideo;Oshiro;Peter;Pradel;Nicolas;Principe;Giacomo;Raffin;Philippe;Rodriguez-Montoya;Ivan;Shaw;Paul;Snow;William;Sridharan;Kumara, Tirupati;Srinivasan;Ranjani;Wei;Ta-Shun;Yu;Chen-Yu |
| 臺大學術典藏 |
2019-12-27T01:16:39Z |
Progress with the single-sided module prototypes for the ATLAS tracker upgrade stave
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Parzefall, U.; Pernecker, S.; Phillips, P.; Poltorak, K.; Puldon, D.; Robinson, D.; Sadrozinski, H.F.-W.; Santoyo, D.; Sattari, S.; Schamberger, D.; Seiden, A.; Sutcliffe, P.; Swientek, K.; Tsionou, D.; Tyndel, M.; Unno, Y.; Viehhauser, G.; Villani, E.G.; Von Wilpert, J.; Wastie, R.; Weber, M.; Weidberg, A.; Wiik, L.; Wilmut, I.; Wormald, M.; Wright, J.; Xu, D.; Stathes Paganis; Fox, H.; French, R.; Gallop, B.; Garc?a, C.; Gerling, M.; Gibson, M.; Gilchriese, M.; Gonzalez Sevilla, S.; Goodrick, M.; Greenall, A.; Grillo, A.A.; Haber, C.H.; Hessey, N.P.; Holt, R.; Hommels, L.B.A.; Jakobs, K.; Jones, T.J.; Kaplon, J.; Kierstead, J.; Koffeman, E.; K?hler, M.; Lacasta, C.; La Marra, D.; Li, Z.; Lindgren, S.; Lynn, D.; Maddock, P.; Mahboubi, K.; Martinez-Mckinney, F.; Matheson, J.; Maunu, R.; McCarthy, R.; Newcomer, M.; Nickerson, R.; O'Shea, V.; Paganis, S.; Allport, P.P.; Affolder, A.A.; Anghinolfi, F.; Bates, R.; Betancourt, C.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Civera, J.V.; Clark, A.; Colijn, A.P.; Dabrowski, W.; Dawson, N.; Dewilde, B.; Dhawan, S.; Dressnandt, N.; Dwu?nik, M.; Eklund, L.; Fadeyev, V.; Farthouat, P.; Ferr?re, D. |
| 臺大學術典藏 |
2019-12-27T01:16:38Z |
Development of n-on-p silicon sensors for very high radiation environments
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Jakobs, K.; Kamada, S.; Kierstead, J.; Kodys, P.; Kohler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lindgren, S.; Lynn, D.; Mikestikova, M.; Maddock, P.; Mandic, I.; Marti I Garcia, S.; Martinez-Mckinney, F.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikuz, M.; Minano, M.; Mitsui, S.; O'Shea, V.; Paganis, S.; Parzefall, U.; Puldon, D.; Robinson, D.; Sadrozinski, H.F.-W.; Sattari, S.; Schamberger, D.; Seidel, S.; Seiden, A.; Terada, S.; Toms, K.; Tsionou, D.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Yamamura, K.; Stathes Paganis; Unno, Y.; Affolder, A.A.; Allport, P.P.; Bates, R.; Betancourt, C.; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferrere, D.; Fox, H.; French, R.; Garcia, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hara, K.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y. |
| 臺大學術典藏 |
2019-12-27T01:16:38Z |
Testing of surface properties pre-rad and post-rad of n-in-p silicon sensors for very high radiation environment
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Seidel, S.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Stathes Paganis; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferr?rre, D.; Fox, H.; French, R.; Garc?a, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hara, K.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K?hler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lynn, D.; Maddock, P.; Mandi?, I.; Martinez-Mckinney, F.; Garcia, S.M.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikestikova, M.; Miku?, M.; Mi?ano, M.; Mitsui, S.; O'Shea, V.; Parzefall, U.; Sadrozinski, H.F.-W.; Schamberger, D.; Seiden, A.; Terada, S.; Paganis, S.; Robinson, D.; Puldon, D.; Sattari, S.; Betancourt, C.; Lindgren, S.; Affolder, A.A.; Allport, P.P.; Bates, R. |
| 臺大學術典藏 |
2019-12-27T01:16:37Z |
Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments
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Hara, K.;Affolder, A.A.;Allport, P.P.;Bates, R.;Betancourt, C.;Bohm, J.;Brown, H.;Buttar, C.;Carter, J.R.;Casse, G.;Chen, H.;Chilingarov, A.;Cindro, V.;Clark, A.;Dawson, N.;Dewilde, B.;Doherty, F.;Dolezal, Z.;Eklund, L.;Fadeyev, V.;Ferrere, D.;Fox, H.;French, R.;Garc?a, C.;Gerling, M.;Gonzalez Sevilla, S.;Gorelov, I.;Greenall, A.;Grillo, A.A.;Hamasaki, N.;Hatano, H.;Hoeferkamp, M.;Hommels, L.B.A.;Ikegami, Y.;Jakobs, K.;Kierstead, J.;Kodys, P.;K?hler, M.;Kohriki, T.;Kramberger, G.;Lacasta, C.;Li, Z.;Lindgren, S.;Lynn, D.;Maddock, P.;Mandi?, I.;Martinez-Mckinney, F.;Mart? I Garcia, S.;Maunu, R.;McCarthy, R.;Metcalfe, J.;Mikestikova, M.;Miku?, M.;Mi?ano, M.;Mitsui, S.;O'Shea, V.;Parzefall, U.;Sadrozinski, H.F.-W.;Schamberger, D.;Seiden, A.;Terada, S.;Paganis, S.;Robinson, D.;Puldon, D.;Sattari, S.;Seidel, S.;Takahashi, Y.;Toms, K.;Tsionou, D.;Unno, Y.;Von Wilpert, J.;Wormald, M.;Wright, J.;Yamada, M.; Hara, K.; Affolder, A.A.; Allport, P.P.; Bates, R.; Betancourt, C.; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferrere, D.; Fox, H.; French, R.; Garc?a, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K?hler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lindgren, S.; Lynn, D.; Maddock, P.; Mandi?, I.; Martinez-Mckinney, F.; Mart? I Garcia, S.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikestikova, M.; Miku?, M.; Mi?ano, M.; Mitsui, S.; O'Shea, V.; Parzefall, U.; Sadrozinski, H.F.-W.; Schamberger, D.; Seiden, A.; Terada, S.; Paganis, S.; Robinson, D.; Puldon, D.; Sattari, S.; Seidel, S.; Takahashi, Y.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Stathes Paganis |
| 臺大學術典藏 |
2019-12-27T01:16:37Z |
Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments
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Hara, K.;Affolder, A.A.;Allport, P.P.;Bates, R.;Betancourt, C.;Bohm, J.;Brown, H.;Buttar, C.;Carter, J.R.;Casse, G.;Chen, H.;Chilingarov, A.;Cindro, V.;Clark, A.;Dawson, N.;Dewilde, B.;Doherty, F.;Dolezal, Z.;Eklund, L.;Fadeyev, V.;Ferrere, D.;Fox, H.;French, R.;Garc?a, C.;Gerling, M.;Gonzalez Sevilla, S.;Gorelov, I.;Greenall, A.;Grillo, A.A.;Hamasaki, N.;Hatano, H.;Hoeferkamp, M.;Hommels, L.B.A.;Ikegami, Y.;Jakobs, K.;Kierstead, J.;Kodys, P.;K?hler, M.;Kohriki, T.;Kramberger, G.;Lacasta, C.;Li, Z.;Lindgren, S.;Lynn, D.;Maddock, P.;Mandi?, I.;Martinez-Mckinney, F.;Mart? I Garcia, S.;Maunu, R.;McCarthy, R.;Metcalfe, J.;Mikestikova, M.;Miku?, M.;Mi?ano, M.;Mitsui, S.;O'Shea, V.;Parzefall, U.;Sadrozinski, H.F.-W.;Schamberger, D.;Seiden, A.;Terada, S.;Paganis, S.;Robinson, D.;Puldon, D.;Sattari, S.;Seidel, S.;Takahashi, Y.;Toms, K.;Tsionou, D.;Unno, Y.;Von Wilpert, J.;Wormald, M.;Wright, J.;Yamada, M.; Hara, K.; Affolder, A.A.; Allport, P.P.; Bates, R.; Betancourt, C.; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferrere, D.; Fox, H.; French, R.; Garc?a, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K?hler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lindgren, S.; Lynn, D.; Maddock, P.; Mandi?, I.; Martinez-Mckinney, F.; Mart? I Garcia, S.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikestikova, M.; Miku?, M.; Mi?ano, M.; Mitsui, S.; O'Shea, V.; Parzefall, U.; Sadrozinski, H.F.-W.; Schamberger, D.; Seiden, A.; Terada, S.; Paganis, S.; Robinson, D.; Puldon, D.; Sattari, S.; Seidel, S.; Takahashi, Y.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Stathes Paganis |
| 臺大學術典藏 |
2019-12-27T01:16:37Z |
Evaluation of the bulk and strip characteristics of large area n-in-p silicon sensors intended for a very high radiation environment
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Lacasta, C.; Li, Z.; Lindgren, S.; Lynn, D.; Maddock, P.; Mandic, I.; Marti I Garcia, S.; Martinez-Mckinney, F.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikuz, M.; Minano, M.; Mitsui, S.; O'Shea, V.; Paganis, S.; Parzefall, U.; Puldon, D.; Robinson, D.; Sadrozinski, H.F.-W.; Sattari, S.; Schamberger, D.; Seidel, S.; Seiden, A.; Soldevila, U.; Terada, S.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Stathes Paganis; Bohm, J.; Mikestikova, M.; Affolder, A.A.; Allport, P.P.; Bates, R.; Betancourt, C.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferrere, D.; Fox, H.; French, R.; Garcia, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hara, K.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K?hler, M.; Kohriki, T.; Krambergen, G. |
| 臺大學術典藏 |
2018-09-10T08:45:42Z |
Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments
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Affolder, A.A.; Allport, P.P.; Bates, R.; Betancourt, C.; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferrere, D.; Fox, H.; French, R.; Garc\\'ia, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K\\ohler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lindgren, S.; Lynn, D.; Maddock, P.; M; i?, I.; Martinez-Mckinney, F.; Mart\\'i I Garcia, S.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikestikova, M.; Miku?, M.; Mi\\~nano, M.; Mitsui, S.; O'Shea, V.; Parzefall, U.; Sadrozinski, H.F.-W.; Schamberger, D.; Seiden, A.; Terada, S.; Paganis, S.; Robinson, D.; Puldon, D.; Sattari, S.; Seidel, S.; Takahashi, Y.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Hara, K.; Stathes Paganis et al. |
| 臺大學術典藏 |
2018-09-10T08:45:42Z |
Testing of surface properties pre-rad and post-rad of n-in-p silicon sensors for very high radiation environment
|
Affolder, A.A.; Allport, P.P.; Bates, R.; Betancourt, C.; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferr\\`erre, D.; Fox, H.; French, R.; Garc\\'ia, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hara, K.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K\\ohler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lynn, D.; Maddock, P.; M; i?, I.; Martinez-Mckinney, F.; Garcia, S.M.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikestikova, M.; Miku?, M.; Mi\\~nano, M.; Mitsui, S.; O'Shea, V.; Parzefall, U.; Sadrozinski, H.F.-W.; Schamberger, D.; Seiden, A.; Terada, S.; Paganis, S.; Robinson, D.; Puldon, D.; Sattari, S.; Seidel, S.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Lindgren, S.; Stathes Paganis et al. |
| 臺大學術典藏 |
2018-09-10T08:45:41Z |
Evaluation of the bulk and strip characteristics of large area n-in-p silicon sensors intended for a very high radiation environment
|
Stathes Paganis; Mikestikova, M.; Affolder, A.A.; Allport, P.P.; Bates, R.; Betancourt, C.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferrere, D.; Fox, H.; French, R.; Garcia, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hara, K.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K\\ohler, M.; Kohriki, T.; Krambergen, G.; Lacasta, C.; Li, Z.; Lindgren, S.; Lynn, D.; Maddock, P.; M; ic, I.; Marti I Garcia, S.; Martinez-Mckinney, F.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikuz, M.; Minano, M.; Mitsui, S.; O'Shea, V.; Paganis, S.; Parzefall, U.; Puldon, D.; Robinson, D.; Sadrozinski, H.F.-W.; Sattari, S.; Schamberger, D.; Seidel, S.; Seiden, A.; Soldevila, U.; Terada, S.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M. |
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