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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立臺灣海洋大學 2010-06 A TEM investigation of retained defects in Si wafer by 1 MeV Si ions bombardment J. Y. Hsu; R. T. Huang; M. J. Hung; Y.C. Yu

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