臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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机构	日期	题名	作者
臺大學術典藏	2020-10-07T01:23:20Z	Static Noise Margin of Ultrathin-Body SOI Subthreshold SRAM Cells—An Assessment Based on Analytical Solutions of Poisson's Equation	Y.-S. Wu; V. P.-H. Hu; V. P.-H. Hu;Y.-S. Wu;M.-L. Fan;P. Su;C.-T. Chuang; M.-L. Fan; P. Su; C.-T. Chuang; VITA PI-HO HU; V. P.-H. Hu; Y.-S. Wu; M.-L. Fan; P. Su; C.-T. Chuang; 胡璧合; VITA PI-HO HU
臺大學術典藏	2020-10-07T01:23:20Z	Static Noise Margin of Ultrathin-Body SOI Subthreshold SRAM Cells—An Assessment Based on Analytical Solutions of Poisson's Equation	Y.-S. Wu; V. P.-H. Hu; V. P.-H. Hu;Y.-S. Wu;M.-L. Fan;P. Su;C.-T. Chuang; M.-L. Fan; P. Su; C.-T. Chuang; VITA PI-HO HU; V. P.-H. Hu; Y.-S. Wu; M.-L. Fan; P. Su; C.-T. Chuang; 胡璧合; VITA PI-HO HU
臺大學術典藏	2020-10-07T01:23:20Z	Static Noise Margin of Ultrathin-Body SOI Subthreshold SRAM Cells—An Assessment Based on Analytical Solutions of Poisson's Equation	Y.-S. Wu; V. P.-H. Hu; V. P.-H. Hu;Y.-S. Wu;M.-L. Fan;P. Su;C.-T. Chuang; M.-L. Fan; P. Su; C.-T. Chuang; VITA PI-HO HU; V. P.-H. Hu; Y.-S. Wu; M.-L. Fan; P. Su; C.-T. Chuang; 胡璧合; VITA PI-HO HU
臺大學術典藏	2020-10-07T01:23:19Z	Analysis of Ultra-Thin-Body SOI Subthreshold SRAM Considering Line-Edge Roughness, Work Function Variation, and Temperature Sensitivity	P. Su; C.-T. Chuang; VITA PI-HO HU; V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang; 胡璧合; VITA PI-HO HU; M.-L. Fan; V. P.-H. Hu;M.-L. Fan;P. Su;C.-T. Chuang; V. P.-H. Hu
臺大學術典藏	2020-10-07T01:23:19Z	Analysis of Ultra-Thin-Body SOI Subthreshold SRAM Considering Line-Edge Roughness, Work Function Variation, and Temperature Sensitivity	P. Su; C.-T. Chuang; VITA PI-HO HU; V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang; 胡璧合; VITA PI-HO HU; M.-L. Fan; V. P.-H. Hu;M.-L. Fan;P. Su;C.-T. Chuang; V. P.-H. Hu
臺大學術典藏	2020-10-07T01:23:19Z	Analysis of Ultra-Thin-Body SOI Subthreshold SRAM Considering Line-Edge Roughness, Work Function Variation, and Temperature Sensitivity	P. Su; C.-T. Chuang; VITA PI-HO HU; V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang; 胡璧合; VITA PI-HO HU; M.-L. Fan; V. P.-H. Hu;M.-L. Fan;P. Su;C.-T. Chuang; V. P.-H. Hu
臺大學術典藏	2020-10-07T01:23:18Z	Band-to-Band-Tunneling Leakage Suppression for Ultra-Thin-Body GeOI MOSFETs Using Transistor Stacking	VITA PI-HO HU; 胡璧合; C.-T. Chuang; P. Su; M.-L. Fan; V. P.-H. Hu; VITA PI-HO HU; V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang
臺大學術典藏	2020-10-07T01:23:18Z	Band-to-Band-Tunneling Leakage Suppression for Ultra-Thin-Body GeOI MOSFETs Using Transistor Stacking	VITA PI-HO HU; 胡璧合; C.-T. Chuang; P. Su; M.-L. Fan; V. P.-H. Hu; VITA PI-HO HU; V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang
臺大學術典藏	2020-10-07T01:23:17Z	Analysis of Single-Trap-Induced Random Telegraph Noise on FinFET Devices, 6T SRAM Cell, and Logic Circuits	VITA PI-HO HU; 胡璧合; C.-T. Chuang; P. Su; Y.-N. Chen; V. P.-H. Hu; M.-L. Fan; VITA PI-HO HU; C.-T. Chuang; Y.-N. Chen; P. Su; V. P.-H. Hu; M.-L. Fan
臺大學術典藏	2020-10-07T01:23:17Z	Analysis of Single-Trap-Induced Random Telegraph Noise on FinFET Devices, 6T SRAM Cell, and Logic Circuits	VITA PI-HO HU; 胡璧合; C.-T. Chuang; P. Su; Y.-N. Chen; V. P.-H. Hu; M.-L. Fan; VITA PI-HO HU; C.-T. Chuang; Y.-N. Chen; P. Su; V. P.-H. Hu; M.-L. Fan

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