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Showing items 1-10 of 59 (6 Page(s) Totally)
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| 臺大學術典藏 |
2020-10-07T01:23:20Z |
Static Noise Margin of Ultrathin-Body SOI Subthreshold SRAM Cells—An Assessment Based on Analytical Solutions of Poisson's Equation
|
Y.-S. Wu; V. P.-H. Hu; V. P.-H. Hu;Y.-S. Wu;M.-L. Fan;P. Su;C.-T. Chuang; M.-L. Fan; P. Su; C.-T. Chuang; VITA PI-HO HU; V. P.-H. Hu; Y.-S. Wu; M.-L. Fan; P. Su; C.-T. Chuang; 胡璧合; VITA PI-HO HU |
| 臺大學術典藏 |
2020-10-07T01:23:20Z |
Static Noise Margin of Ultrathin-Body SOI Subthreshold SRAM Cells—An Assessment Based on Analytical Solutions of Poisson's Equation
|
Y.-S. Wu; V. P.-H. Hu; V. P.-H. Hu;Y.-S. Wu;M.-L. Fan;P. Su;C.-T. Chuang; M.-L. Fan; P. Su; C.-T. Chuang; VITA PI-HO HU; V. P.-H. Hu; Y.-S. Wu; M.-L. Fan; P. Su; C.-T. Chuang; 胡璧合; VITA PI-HO HU |
| 臺大學術典藏 |
2020-10-07T01:23:20Z |
Static Noise Margin of Ultrathin-Body SOI Subthreshold SRAM Cells—An Assessment Based on Analytical Solutions of Poisson's Equation
|
Y.-S. Wu; V. P.-H. Hu; V. P.-H. Hu;Y.-S. Wu;M.-L. Fan;P. Su;C.-T. Chuang; M.-L. Fan; P. Su; C.-T. Chuang; VITA PI-HO HU; V. P.-H. Hu; Y.-S. Wu; M.-L. Fan; P. Su; C.-T. Chuang; 胡璧合; VITA PI-HO HU |
| 臺大學術典藏 |
2020-10-07T01:23:19Z |
Analysis of Ultra-Thin-Body SOI Subthreshold SRAM Considering Line-Edge Roughness, Work Function Variation, and Temperature Sensitivity
|
P. Su; C.-T. Chuang; VITA PI-HO HU; V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang; 胡璧合; VITA PI-HO HU; M.-L. Fan; V. P.-H. Hu;M.-L. Fan;P. Su;C.-T. Chuang; V. P.-H. Hu |
| 臺大學術典藏 |
2020-10-07T01:23:19Z |
Analysis of Ultra-Thin-Body SOI Subthreshold SRAM Considering Line-Edge Roughness, Work Function Variation, and Temperature Sensitivity
|
P. Su; C.-T. Chuang; VITA PI-HO HU; V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang; 胡璧合; VITA PI-HO HU; M.-L. Fan; V. P.-H. Hu;M.-L. Fan;P. Su;C.-T. Chuang; V. P.-H. Hu |
| 臺大學術典藏 |
2020-10-07T01:23:19Z |
Analysis of Ultra-Thin-Body SOI Subthreshold SRAM Considering Line-Edge Roughness, Work Function Variation, and Temperature Sensitivity
|
P. Su; C.-T. Chuang; VITA PI-HO HU; V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang; 胡璧合; VITA PI-HO HU; M.-L. Fan; V. P.-H. Hu;M.-L. Fan;P. Su;C.-T. Chuang; V. P.-H. Hu |
| 臺大學術典藏 |
2020-10-07T01:23:18Z |
Band-to-Band-Tunneling Leakage Suppression for Ultra-Thin-Body GeOI MOSFETs Using Transistor Stacking
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VITA PI-HO HU; 胡璧合; C.-T. Chuang; P. Su; M.-L. Fan; V. P.-H. Hu; VITA PI-HO HU; V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang |
| 臺大學術典藏 |
2020-10-07T01:23:18Z |
Band-to-Band-Tunneling Leakage Suppression for Ultra-Thin-Body GeOI MOSFETs Using Transistor Stacking
|
VITA PI-HO HU; 胡璧合; C.-T. Chuang; P. Su; M.-L. Fan; V. P.-H. Hu; VITA PI-HO HU; V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang |
| 臺大學術典藏 |
2020-10-07T01:23:17Z |
Analysis of Single-Trap-Induced Random Telegraph Noise on FinFET Devices, 6T SRAM Cell, and Logic Circuits
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VITA PI-HO HU; 胡璧合; C.-T. Chuang; P. Su; Y.-N. Chen; V. P.-H. Hu; M.-L. Fan; VITA PI-HO HU; C.-T. Chuang; Y.-N. Chen; P. Su; V. P.-H. Hu; M.-L. Fan |
| 臺大學術典藏 |
2020-10-07T01:23:17Z |
Analysis of Single-Trap-Induced Random Telegraph Noise on FinFET Devices, 6T SRAM Cell, and Logic Circuits
|
VITA PI-HO HU; 胡璧合; C.-T. Chuang; P. Su; Y.-N. Chen; V. P.-H. Hu; M.-L. Fan; VITA PI-HO HU; C.-T. Chuang; Y.-N. Chen; P. Su; V. P.-H. Hu; M.-L. Fan |
Showing items 1-10 of 59 (6 Page(s) Totally)
1 2 3 4 5 6 > >>
View [10|25|50] records per page
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