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Institution Date Title Author
國立中山大學 2008 Atomic-layer-deposited HfO2 on In0.53Ga0.47As: Passivation and energy-band parameters Y.C. Chang;M.L. Huang;K.Y. Lee;Y.J. Lee;T.D. Lin;M. Hong;J. Kwo;T.S. Lay;C.C. Liao;K.Y. Cheng
國立中山大學 2004-01 Characteristics of surface ruptures associated with the Chi-Chi earthquake of September 21, 1999 C.W. Lin;Y.L. Lee;M.L. Huang;W.C. Lai;B.D. Yuan;C.Y. Huang
義守大學 2002-12 Study on failure mechanism of PCT reliability for BT substrate based CSP (chip scale package) C. L. Chung;James Fan;M. L. Huang;F. J. Tsai
義守大學 2002-12 Environmental friendly CSP C.L. Chung;Penny Kao;S. L. Fu;Steven Chou;Alex Lu;R.B. Tsai;Y.J. lee;M.L.Huang;Peter Ku
義守大學 2002-11 Influences of material source, wafer process and location on silicon die fracture strength D. S. Liu;Y. S. Shih;C. Y. Ni;D. Y. Chiou;C. L. Chung;M. L. Huang
國立高雄應用科技大學 1978-04 Influence of Size Effect on Electrical Conductiuity C. Y. Chang; 張啟陽; M. L Huang; 黃美蘭

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