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"maikap s"
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| 國立臺灣大學 |
2005-05 |
Recent Progress in Mobility-enhancement Technologies
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Liu, C. W.; Maikap, S.; Yu, C.-Y. |
| 國立臺灣大學 |
2005 |
Abnormal hole mobility of biaxial strained Si
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Liao, M. H.; Chang, S. T.; Lee, M. H.; Maikap, S.; Liu, C. W. |
| 國立臺灣大學 |
2004-10 |
Ge Outdiffusion Effect on Flicker Noise in Strained-Si nMOSFETs
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Hua, W.C.; Lee, M.H.; Chen, P.S.; Maikap, S.; Liu, C.W.; Chen, K.M. |
| 國立臺灣大學 |
2004 |
Mechanically strained Si/SiGe HBTs
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Yuan, F.; Jan, S.-R.; Maikap, S.; Liu, Y.-H.; Liang, C.-S.; Liu, C.W. |
| 國立臺灣大學 |
2004 |
Mechanically strained strained-Si NMOSFETs
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Maikap, S.; Yu, C.-Y.; Jan, S.-R.; Lee, M.H.; Liu, C.W. |
| 國立臺灣大學 |
2004 |
Evidence of Si/SiGe heterojunction roughness scattering
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Liu, C. W.; Lee, M. H.; Lee, Y. C.; Chen, P. S.; Yu, C.-Y.; Wei, J.-Y.; Maikap, S. |
| 臺大學術典藏 |
2004 |
Evidence of Si/SiGe heterojunction roughness scattering
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Liu, C. W.; Lee, M. H.; Lee, Y. C.; Chen, P. S.; Yu, C.-Y.; Wei, J.-Y.; Maikap, S.Liucw; Liu, C. W.; Lee, M. H.; Lee, Y. C.; Chen, P. S.; Yu, C.-Y.; Wei, J.-Y.; Maikap, S.; LiuCW |
Showing items 31-37 of 37 (2 Page(s) Totally)
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