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Showing items 1-3 of 3 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立成功大學 |
2011-12 |
Accelerated Destructive Degradation Tests Robust to Distribution Misspecification
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Jeng, Shuen-Lin; Huang, Bei-Ying; Meeker, William Q. |
國立成功大學 |
2011-12 |
Accelerated Destructive Degradation Tests Robust to Distribution Misspecification
|
鄭順林; JENG, SHUEN-LIN; Jeng, Shuen-Lin;Huang, Bei-Ying;Meeker, William Q. |
國立成功大學 |
1998-05 |
Accelerated degradation tests: Modeling and analysis
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Meeker, William Q.; Escobar, Luis A.; Lu, Chi-Hsien Joseph |
Showing items 1-3 of 3 (1 Page(s) Totally) 1 View [10|25|50] records per page
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