臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Showing items 1-6 of 6 (1 Page(s) Totally)
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Institution	Date	Title	Author
國立高雄師範大學	2013-10	Characteristics of hafnium oxide resistance random access memory with different setting compliance current	陳榮輝; Rong-Huei Chen;Yu-Ting Su;Kuan-Chang Chang;Ting-Chang Chang;Tsung-Ming Tsai;Rui Zhang;J. C. Lou;Tai-Fa Young;Kai-Huang Chen;Bae-Heng Tseng;Chih-Cheng Shih;Ya-Liang Yang;Min-Chen Chen;Tian-Jian Chu;Chih-Hung Pan;Yong-En Syu;Simon M. Sze
國立高雄師範大學	2013-08	Electrical conduction mechanism of Zn:SiOx resistance random access memory with supercritical CO2 fluid process	陳榮輝; Rong-Huei Chen;Kuan-Chang Chang;Tsung-Ming Tsai;Rui Zhang;Ting-Chang Chang;Kai-Huang Chen;Jung-Hui Chen;Tai-Fa Young; J. C. Lou;Tian-Jian Chu;Chih-Cheng Shih;Jhih-Hong Pan;Yu-Ting Su;Yong-En Syu; Cheng-Wei Tung;Min-Chen Chen;Jia-Jie Wu;Ying Hu;Simon M. Sze
國立高雄師範大學	2013-07	Endurance Improvement Technology With Nitrogen Implanted in the Interface of WSiOx Resistance Switching Device	陳榮輝; Rong-Huei Chen;Yong-En Syu;Rui Zhang;Ting-Chang Chang;Tsung-Ming Tsai;Kuan-Chang Chang;Jen-Chung Lou;Tai-Fa Young;Min-Chen Chen;Ya-Liang Yang;Chih-Cheng Shih;Tian-Jian Chu;Jian-Yu Chen;Chih-Hung Pan;Yu-Ting Su;Hui-Chun Huang;Der-Shin Gan;Simon M. Sze
國立高雄師範大學	2013-05	Origin of Hopping Conduction in Graphene Oxide-Doped Silicon Oxide Resistance Random Access Memory Devices	陳榮輝; Rong-Huei Chen;Kuan-Chang Chang;Rui Zhang;Ting-Chang Chang;Tsung-Ming Tsai;Jen-Chung Lou;Tai-Fa Young;Min-Chen Chen;Ya-Liang Yang;Yin-Chih Pan;Geng-Wei Chang;Tian-Jian Chu;Chih-Cheng Shih;Jian-Yu Chen;Chih-Hung Pan;Yu-Ting Su;Yong-En Syu;Ya-Hsiang Tai;Simon M. Sze
國立高雄師範大學	2013-04	Low Temperature Improvement Method on Zn:SiOx Resistive Random Access Memory Devices	陳榮輝; Rong-Huei Chen;Kuan-Chang Chang;Tsung-Ming Tsai;Ting-Chang Chang;Hsing-Hua Wu;Kai-Huang Chen;Tai-Fa Young;Tian-Jian Chu;Jian-Yu Chen;Chih-Hung Pan;Yu-Ting Su;Yong-En Syu;Cheng-Wei Tung;Geng-Wei Chang;Min-Chen Chen;Hui-Chun Huang;Ya-Hsiang Tai;Der-Shin Gan;Jia-Jie Wu;Ying Hu;Simon M. Sze
國立高雄師範大學	2013-03	Characteristics and Mechanisms of Silicon Oxide Based Resistance Random Access Memory	陳榮輝; Rong-Huei Chen;Kuan-Chang Chang;Tsung-Ming Tsai;Ting-Chang Chang;Hsing-Hua Wu;Yong-En Syu;Geng-Wei Chang;Tian-Jian Chu;Guan-Ru Liu;Yu-Ting Su;Min-Chen Chen;Jhih-Hong Pan;Jian-Yu Chen;Cheng-Wei Tung;Hui-Chun Huang;Ya-Hsiang Tai;Der-Shin Gan;Simon M. Sze

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