臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
義守大學	2010-11	Characteristics between Electrical Properties and Controlling of Oxygen Precipitations during ULSI Process	Po-Ying Chen;Shih-Chun Hung;Wen-Kuan Yeh;Ming Hsiung Tsai;Wei-Chou Chen;Kang-Ping Li;Pei-Chen Yeh;Hsin-Ying Huang
義守大學	2008/08/20	Dynamic scanning method to clarify the mechanism of WLCSP package reliability issue	Po-Ying Chen ; Chwei-Shyong Tsai ; Ming-Hsiung Tsai ; Heng-Yu Kung ; Shen-Li Chen ; Jing, M.H. ; Wen-Kuan Yeh
義守大學	2008-10	Elucidating the effects of current stress history on reliability characteristics by dynamic analysis	Po-Ying Chen;Shen-Li Chen;Ming-Hsiung Tsai;Wen-Kuan Yeh;Heng-Yu Kung;YuKon Chang
義守大學	2008-02	Reliability and characteristics of wafer-level chip-scale packages under current stress	Po-Ying Chen;Heng-Yu Kung;Yi-Shao Lai;Ming Hsiung Tsai;Wen-Kuan Yeh
義守大學	2007/07/11	The Defects of Silicon Reacted with Carbon Content Vapour in ULSI Nano-meter-Generation Technology	Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C. ; Cheng-Chia Kuo
義守大學	2007/07/11	The Defects of Silicon Reacted with Carbon Content Vapour in ULSI Nano-meter-Generation Technology	Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C. ; Cheng-Chia Kuo
義守大學	2007/07/11	The Failure Mode Investigation of Barrier Layer TaN Combined with Al Pad Architecture using in Cu Process	Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C.
中原大學	2000	心房撲動週期長度變異度之分析	蔡明雄; Ming-Hsiung Tsai

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