臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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	臺大學術典藏NTU Scholars

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Institution	Date	Title	Author
國立臺灣海洋大學	2013	Computationally Improved Optimal Control Methodology for Linear Programming Problems of Flexible Manufacturing Systems	Yen-Liang Pan;Yi-Sheng Huang;Yi-Shun Weng;Weimin Wu;MuDer Jeng
國立臺灣海洋大學	2013	Based on Synchronized Timed Petri Nets for Urban Traffic Control Systems	Yi-Sheng Huang; Yi-Shun Weng; MuDer Jeng; Bo-Yang Chen
國立臺灣海洋大學	2012	Enhancement of an Efficient Control Policy for FMSs Using the Theory of Regions and Selective Method	Yen-Liang Pan; Yi-Sheng Huang; MuDer Jeng; Sheng-Luen Chung
國立臺灣海洋大學	2012	Enhancement of an efficient control policy for FMSs using the theory of regions and selective siphon method	Yen-Liang Pan; Yi-Sheng Huang; MuDer Jeng; Sheng-Luen Chung
國立臺灣海洋大學	2011-11	Applying Regional Level-Set Formulation to Postsawing Four-Element LED Wafer Inspection	Chun-Hsi Li; Chuan-Yu Chang; MuDer Jeng
國立臺灣海洋大學	2011	Applying Regional Level-Set Formulation to Post-Sawing Four-element LED Wafer Inspection	Chun-Hsi Li; huan-Yu Chang; MuDer Jeng
國立臺灣海洋大學	2011	Fault measure of discrete event systems using probabilistic timed automata	Yi-Sheng Huang; Ho-Shan Chiang; MuDer Jeng
國立臺灣海洋大學	2010	Management and Control of Information Flow in CIM Systems Using UML and Petri Nets	Chang-Pin Lin;Li-Der Jeng;Yi-Ping Lin;Muder Jeng
國立臺灣海洋大學	2009-12	Wafer Defect Inspection by Neural Analysis of Region Features	Chuan-Yu Chang; Chun-Hsi Li; Yung-Chi Chang; MuDer Jeng
國立臺灣海洋大學	2009-03-31	Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection	Chuan-Yu Chang;Chun-Hsi Li;Si-Yan Lin;MuDer Jeng
國立臺灣海洋大學	2008-10	Diagnosable discrete event system design: A case study of automatic temperature control system	YuanLin Wen;MuDer Jeng
國立臺灣海洋大學	2008-01	Learning vector quantization neural networks for LED wafer defect inspection	Chuan-Yu Chang; Chin-Huang Chang; Chun-Hsi Li; MuDer Jeng
國立臺灣海洋大學	2008	A Maximally Permissive Deadlock Prevention Policy for FMS Based on Petri Net Siphon Control and the Theory of Regions	Zhiwu Li;MengChu Zhou;MuDer Jeng
國立臺灣海洋大學	2007-01	An unsupervised neural network approach for automatic semiconductor wafer defect inspection	Chuan-Yu Chang;ChunHsi Li;Jia-Wei Chang; MuDer Jeng
國立臺灣海洋大學	2007	Inspection Results of the Learning Vector Quantization Neural Networks Based LED Wafer Defect Inspection System	Chuan-Yu Chang;Chin-Huang Chang;Chun-Hsi Li;MuDer Jeng
國立臺灣海洋大學	2007	Intelligent Design of Diagnosable Systems: A Case Study of Semiconductor Manufacturing Machines	YuanLin Wen;Sheng-Luen Chung;LiDer Jeng;MuDer Jeng
國立臺灣海洋大學	2006-11	Siphon-Based Deadlock Prevention Policy for Flexible Manufacturing Systems	Yi-Sheng Huang;MuDer Jeng;Xiaolan Xie;Da-Hsiang Chung
國立臺灣海洋大學	2006-01	An expanded SEMATECH CIM framework for heterogeneous applications integration	Chang-Pin Lin;MuDer Jeng
國立臺灣海洋大學	2006	An Intelligent Technique Based on Petri Nets for Diagnosability Enhancement of Discrete Event Systems	YuanLin Wen;MuDer Jeng;LiDer Jeng;Fan Pei-Shu
國立臺灣海洋大學	2006	An Intelligent Technique Based on Petri Nets for Diagnosablity Enhancement of Discrete Event Systems	YuanLin Wen; MuDer Jeng; LiDer Jeng; Fan Pei-Shu
國立臺灣海洋大學	2005-03	Discrete event system techniques for CIM: Guest editorial	Muder Jeng;Xiaolan Xie
國立臺灣海洋大學	2005-03	Separation model design of manufacturing systems using the distributed agent-oriented Petri net	Chung-Hsien Kuo;Han-Pang Huang;Muder Jeng;Li-Der Jeng
國立臺灣海洋大學	2005	Management and control of information flow in CIM systems using UML and Petri nets	Chang-Pin Lin;Li-Der Jeng;Yi-Ping Lin;Muder Jeng
國立臺灣科技大學	2004-09	Scenario normalization techniques - inline stepper coordinator design	Sheng-Lueng Chung;MuDer Jeng
國立臺灣海洋大學	2004-09	Scenario Normalization Techniques: In-line Stepper Coordinator Design by the Sequence Diagram and Production Rules	Sheng-Lueng Chung; MuDer Jeng

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