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"nidhi karuna"的相關文件
顯示項目 1-9 / 9 (共1頁)
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| 國立交通大學 |
2020-10-05T01:59:50Z |
Energy Transformation Between the Inductor and the Power Transistor for the Unclamped Inductive Switching (UIS) Test
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Nidhi, Karuna; Lee, Jian-Hsing; Huang, Shao-Chang; Ker, Ming-Dou |
| 國立交通大學 |
2019-08-02T02:24:21Z |
Package and Chip Accelerated Aging Methods for Power MOSFET Reliability Evaluation
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Lin, Tingyou; Su, Chauchin; Hung, Chung-Chih; Nidhi, Karuna; Tu, Chily; Huang, Shao-Chang |
| 國立交通大學 |
2019-08-02T02:15:29Z |
Avalanche Ruggedness Capability and Improvement of 5-V n-Channel Large-Array MOSFET in BCD Process
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Nidhi, Karuna; Ker, Ming-Dou; Lee, Jian-Hsing; Huang, Shao-Chang |
| 國立交通大學 |
2018-08-21T05:54:11Z |
A CMOS-Process-Compatible Low-Voltage Junction-FET With Adjustable Pinch-Off Voltage
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Nidhi, Karuna; Ker, Ming-Dou |
| 國立交通大學 |
2018-08-21T05:53:47Z |
Improving Safe-Operating-Area o f a 5-V n-Channel Large Array MOSFET in a 0.15-mu m BCD Process
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Nidhi, Karuna; Ker, Ming-Dou; Lin, Tingyou; Lee, Jian-Hsing |
| 亞洲大學 |
201310 |
Effect of Trench Depth and Trench Angle in a High Voltage Polyflanked-Super junction MOSFET
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Kumar, Vijay;Srinat, Grama;Shreyas, Grama Srinath;Nidhi, Karuna;Nidhi, Karuna;Agarw, Neelam;Agarwal, Neelam;Kumar, Ankit;Kumar, Ankit;許健;Sheu, Gene;楊紹明;Yang, Shao-Ming;Mri, Aryadeep;Mrinal, Aryadeep |
| 亞洲大學 |
201306 |
Unclamped Inductive Switching Stress Failure Mechanism of LDMOS
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Kumar, Vijay;Srinat, Grama;Shreyas, Grama Srinath;Khau, Chinmoy;Khaund, Chinmoy;Agarw, Neelam;Agarwal, Neelam;Nidhi, Karuna;Nidhi, Karuna;楊紹明;Yang, Shao-Ming;許健;Sheu, Gene |
| 亞洲大學 |
2013-10 |
Effect of Trench Depth and Trench Angle in a High Voltage Polyflanked-Super junction MOSFET
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Kumar, Vijay;Srinat, Grama;Shreyas, Grama Srinath;Nidhi, Karuna;Nidhi, Karuna;Agarw, Neelam;Agarwal, Neelam;Kumar, Ankit;Kumar, Ankit;許健;Sheu, Gene;楊紹明;Yang, Shao-Ming;Mri, Aryadeep;Mrinal, Aryadeep |
| 亞洲大學 |
2012 |
Unclamped Inductive Switching (UIS) test- A Power MOSFET Reliability Study for Multi-finger Devices
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Nidhi, Karuna |
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