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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立成功大學 2023 Effect of Bi content on the microstructure and mechanical properties of Sn-Bi-Zn-In alloy; [Sn-Bi-Zn-In 合金の微細構造と機械的特性に対する Bi 含有量の影響] Nakawaki, H.;Tatsumi, H.;Nitta, S.;Yang, C.-H.;Lin, S.-K.;Nishikawa, H.
國立成功大學 2023 The Influence of Bi Content on Joint Properties Using Sn-Bi-Zn-In Alloy Nakawaki, H.;Tatsumi, H.;Yang, C.;Lin, S.;Nishikawa, H.
國立成功大學 2023 How to enhance Sn-Bi low-temperature solder by alloying? Lin, S.-K.;Yang, C.-H.;Liu, Y.-C.;Hirata, Y.;Nishikawa, H.
臺大學術典藏 2022-03-22T08:30:22Z Low-pressure micro-silver sintering with the addition of indium for high-temperature power chips attachment Tsai C.-H;Huang W.-C;Chew L.M;Schmitt W;Li J;Nishikawa H;Kao C.R.; Tsai C.-H; Huang W.-C; Chew L.M; Schmitt W; Li J; Nishikawa H; Kao C.R.; C. ROBERT KAO
臺大學術典藏 2022-03-22T08:30:20Z Low-pressure micro-silver sintering with the addition of indium for high-temperature power chips attachment Tsai C.-H;Huang W.-C;Chew L.M;Schmitt W;Li J;Nishikawa H;Kao C.R.; Tsai C.-H; Huang W.-C; Chew L.M; Schmitt W; Li J; Nishikawa H; Kao C.R.; C. ROBERT KAO
臺大學術典藏 2022-03-22T08:27:23Z Low-pressure micro-silver sintering with the addition of indium for high-temperature power chips attachment Tsai C.-H;Huang W.-C;Chew L.M;Schmitt W;Li J;Nishikawa H;Kao C.R.; Tsai C.-H; Huang W.-C; Chew L.M; Schmitt W; Li J; Nishikawa H; Kao C.R.; C. ROBERT KAO
國立成功大學 2022 High-strength Sn–Bi-based low-temperature solders with high toughness designed via high-throughput thermodynamic modelling1 Yang, C.-H.;Liu, Y.-C.;Hirata, Y.;Nishikawa, H.;Lin, S.-K.
國立成功大學 2022 Effect of Low Bi Content on Reliability of Sn-Bi Alloy Joints Before and After Thermal Aging Nishikawa, H.;Hirata, Y.;Yang, C.-H.;Lin, S.-K.
國立成功大學 2022 Effect of low Bi content on mechanical properties of Sn-Bi-Zn-In alloy and its joint with Cu Nishikawa, H.;Hirata, Y.;Yang, C.-H.;Lin, S.-K.
國立成功大學 2022 Mechanical properties of Sn-Bi-Ag low-temperature Pb-free solders Yang, C.-H.;Liu, Y.-C.;Hirata, Y.;Nishikawa, H.;Lin, S.-K.

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