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國立成功大學 |
2008-09-19 |
Pressure-induced valence anomaly in TmTe probed by resonant inelastic x-ray scattering
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Jarrige, I.; Rueff, J. P.; Shieh, S. R.; Taguchi, M.; Ohishi, Y.; Matsumura, T.; Wang, C. P.; Ishii, H.; Hiraoka, N.; Cai, Y. Q. |
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