|
English
|
正體中文
|
简体中文
|
2831143
|
|
???header.visitor??? :
33154186
???header.onlineuser??? :
1074
???header.sponsordeclaration???
|
|
|
???tair.name??? >
???browser.page.title.author???
|
"ota hiroyuki"???jsp.browse.items-by-author.description???
Showing items 1-1 of 1 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立交通大學 |
2018-08-21T05:53:17Z |
Impacts of plasma-induced damage due to UV light irradiation during etching on Ge fin fabrication and device performance of Ge fin field-effect transistors
|
Mizubayashi, Wataru; Noda, Shuichi; Ishikawa, Yuki; Nishi, Takashi; Kikuchi, Akio; Ota, Hiroyuki; Su, Ping-Hsun; Li, Yiming; Samukawa, Seiji; Endo, Kazuhiko |
Showing items 1-1 of 1 (1 Page(s) Totally) 1 View [10|25|50] records per page
|