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| 臺大學術典藏 |
2018-09-10T07:36:57Z |
A novel hot-electron programming method in a buried diffusion bit-line SONOS memory by utilizing nonequilibrium charge transport
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Wang, T.;Tang, C.-J.;Li, C.-W.;Lee, C.-H.;Ou, T.-F.;Chang, Y.-W.;Tsai, W.-J.;Lu, T.-C.;Chen, K.-C.;Lu, C.-Y.; Wang, T.; Tang, C.-J.; Li, C.-W.; Lee, C.-H.; Ou, T.-F.; Chang, Y.-W.; Tsai, W.-J.; Lu, T.-C.; Chen, K.-C.; Lu, C.-Y.; YAO-WEN CHANG |
| 國立交通大學 |
2017-04-21T06:48:15Z |
Insight of stress effect on the ONO stack layer in a SONOS-type flash memory cell
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Yeh, C. C.; Liao, Y. Y.; Wang, Tahui; Tsai, W. J.; Lu, T. C.; Kao, H. L.; Ou, T. F.; Chen, M. S.; Chen, Y. K.; Lai, E. K.; Shih, Y. H.; Ting, WenChi; Ku, Y. H. Joseph; Lit, Chih-Yuan |
| 國立交通大學 |
2014-12-08T15:10:06Z |
A Novel Hot-Electron Programming Method in a Buried Diffusion Bit-Line SONOS Memory by Utilizing Nonequilibrium Charge Transport
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Wang, Tahui; Tang, Chun-Jung; Li, C. -W.; Lee, Chih Hsiung; Ou, T. -F; Chang, Yao-Wen; Tsai, Wen-Jer; Lu, Tao-Cheng; Chen, K. -C.; Lu, Chih-Yuan |
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