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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立東華大學 2008-06 Two-dimensional carrier profiling by Kelvin-probe force Microscopy Tsui B. Y. ; C. M. Hsieh ; P. C. Su ; S. D. Tzeng ; S. Gwo

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