臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Showing items 1-13 of 13 (1 Page(s) Totally)
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Institution	Date	Title	Author
元智大學	2011-06	Influence of annealing temperature on the structural, optical and mechanical properties of ALD-derived ZnO thin films	C.-Y. Yen; S.-R. Jian; G.-J. Chen; C.-M. Lin; H.-Y. Lee; W.-C. Ke; Y.-Y. Liao; P.-F. Yang; C.-T. Wang; Y.-S. Lai; Jason S.-C. Jang; J.-Y. Juang
義守大學	2011-06	Influence of annealing temperature on the structural, optical and mechanical properties of ALD-derived ZnO thin films	C-Y Yen;S.-R. Jian;G.-J. Chen;C.-M. Lin;H.-Y. Lee;W.-C. Ke;Y.-Y. Liao; P.-F. Yang;C.-T. Wang;Y.-S. Lai;Jason S.-C. Jang; J.-Y. Juang
國立中山大學	2009	First-principles calculations of elastic properties of Cu3Sn and Cu6Sn5 intermetallics	J. Chen;Y.S. Lai;P.F. Yang
國立中山大學	2009	Structural and elastic properties of Cu6Sn5 and Cu3Sn from first-principles calculations	J. Chen;Y.S. Lai;P.F. Yang;C.Y. Ren;D.J. Huang
國立中山大學	2009	Nanotribological characteristics of Cu6Sn5, Cu3Sn, and Ni3Sn4 intermetallic compounds	P.F. Yang;S.R. Jian;Y.S. Lai;R.S. Chen
國立中山大學	2009	Structural and mechanical characteristics of (103) AlN thin films prepared by radio frequency magnetron sputtering	P.F. Yang;S.R. Jian;S. Wu;Y.S. Lai;C.T. Wang;R.S. Chen
國立中山大學	2009	Phase transformations in monocrystalline Si induced by repeated nanoindentation	Y.H. Lin;T.C. Chen;Y.S. Lai;P.F. Yang;D.L. Chen
國立中山大學	2009	Evaluation of nanomechanical properties of multi-layer SiGe-Si films	M.H. Lin;H.C. Wen;Y.S. Lai;P.F. Yang
國立中山大學	2009	Nanomechanical characterization of GaN epitaxial layers	H.C. Wen;Y.S. Lai;P.F. Yang;M.H. Lin
國立中山大學	2009	Phase transformations in monocrystalline Si induced by repeated nanoindentation	Y.H. Lin;T.C. Chen;Y.S. Lai;P.F. Yang;D.L. Chen
國立中山大學	2009	Evaluation of nanomechanical properties of multi-layer SiGe-Si films	M.H. Lin;H.C. Wen;Y.S. Lai;P.F. Yang
國立中山大學	2009	Nanomechanical characterization of GaN epitaxial layers	H.C. Wen;Y.S. Lai;P.F. Yang;M.H. Lin
國立中山大學	2009	Cross-sectional transmission electron microscopy studies for deformation behaviors of AlN thin films under Berkovich nanoindentation	S.R. Jian;J.S.C. Jang;G.J. Chen;H.G. Chen;Y.Y. Liao;M.R. Chen;H.L. Kao;P.F. Yang;Y.S. Lai

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