臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
元智大學	May-23	Electromigration-induced Remarkable Intermetallic Compound (IMC) Formation in Micro Joints and Its Prevention	P. T. Lee; C. Y. Lee; W. Z. Hsieh; C. T. Chen; Cheng-En Ho
元智大學	May-20	Self-Annealing Behavior of Electroplated Cu with Different Brightener Concentrations	Cheng-En Ho; C. H. Yang; Y. W. Lee; C. Y. Lee; P. T. Lee
元智大學	May-20	Self-Annealing Behavior of Electroplated Cu with Different Brightener Concentrations	C. H. Yang; Y. W. Lee; C. Y. Lee; P. T. Lee; Cheng-En Ho
元智大學	Mar-21	IMC microstructure modification and mechanical reinforcement of Sn-Ag-Cu/Cu microelectronic joints through an advanced surface finish technique	Cheng-En Ho; S. P. Yang; P. T. Lee; C. Y. Lee; C. C. Chen; T. T. Kuo
元智大學	Mar-16	Real-time X-ray microscopy study of electromigration in microelectronic solder joints	Cheng-En Ho; C. H. Yang; P. T. Lee; C. T. Chen
元智大學	Mar-16	Real-time X-ray microscopy study of electromigration in microelectronic solder joints	Cheng-En Ho; C. H. Yang; P. T. Lee; C. T. Chen
元智大學	Mar-16	Real-time X-ray microscopy study of electromigration in microelectronic solder joints	Cheng-En Ho; C. H. Yang; P. T. Lee; C. T. Chen
元智大學	Jul-21	Synchrotron white Laue nanodiffraction study on the allotropic phase transformation between hexagonal and monoclinic Cu6Sn5	P. T. Lee; W. Z. Hsieh; C. Y. Lee; Y. H. Huang; C. Y. Chiang; C. S. Ku; C. R. Kao; Cheng-En Ho
元智大學	2021/5/12	White X-ray Nanodiffraction Study of Allotropic Phase Transformation of Hexagonal- into Monoclinic-Cu6Sn5	P. T. Lee; W. Z. Hsieh; C. Y. Lee; C. R. Kao; Cheng-En Ho
元智大學	2021/11/13	COMSOL-Multiphysics Simulation of Current Density and Electrolyte Distributions in Cu Pillar Fabrication	P. T. Lee; C. H. Chang; C. Y. Lee; Y. L. Chen; Cheng-En Ho
元智大學	2020/11/7	Thermal Stability and Electrochemical Corrosion of ENEPIG Surface Finish Deposited on the Cu Traces	C. Y. Lee; W. Z. Hsieh; P. T. Lee ; C. H. Li; S. P. Yang; Cheng-En Ho
元智大學	2020/10/21	Microstructure Modification of Fine Copper Lines and Mechanical Reliability	C. Y. Lee; C. P. Pan; P. T. Lee; Y. C. Chiang; H. C. Liu; P. C. Lin; Cheng-En Ho
元智大學	2019/11/15	Nano-XRF and X-ray Nanodiffraction Studies on the Working Mechanism of Flexible Ni(P) Thin Films	W. L. Chou; C. Y. Lee; P. T. Lee; W. Z. Hsieh; C. S. Ku; X. Y. Li; S. C. Tseng; M. T. Tang; Cheng-En Ho
元智大學	2019/11/15	Nano-XRF and X-ray Nanodiffraction Studies on the Working Mechanism of Flexible Ni(P) Thin Films	W. L. Chou; C. Y. Lee; P. T. Lee; W. Z. Hsieh; C. S. Ku; X. Y. Li; S. C. Tseng; M. T. Tang; Cheng-En Ho
元智大學	2015-10-21	Electromigration in Tin Blech Structure	W. Z. Hsieh; P. T. Lee; Cheng-En Ho
國立交通大學	2014-12-12T02:54:11Z	二維準週期性光子晶體雷射之製程與特性分析	蔡豐懋; F. M. Tsai; 李柏璁; P. T. Lee

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