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Showing items 1-6 of 6 (1 Page(s) Totally)
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| 國立成功大學 |
2022 |
Random and Systematic Variation in Nanoscale Hf0.5Zr0.5O2 Ferroelectric FinFETs: Physical Origin and Neuromorphic Circuit Implications
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De, S.;Baig, M.A.;Qiu, B.-H.;M�ller, F.;Le, H.-H.;Lederer, M.;K�mpfe, T.;Ali, T.;Sung, P.-J.;Su, C.-J.;Lee, Y.-J.;Lu, D.D. |
| 國立成功大學 |
2022 |
Neuromorphic Computing with Fe-FinFETs in the Presence of Variation
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De, S.;Baig, M.A.;Qiu, B.-H.;Le, H.-H.;Lee, Y.-J.;Lu, D. |
| 國立成功大學 |
2021 |
Alleviation of charge trapping and flicker noise in HfZrO2-Based Ferroelectric Capacitors by Thermal Engineering
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De, S.;Bu, W.-X.;Qiu, B.-H.;Su, C.-J.;Lee, Y.-J.;Lu, D.D. |
| 國立成功大學 |
2021 |
Ultra-Low Power Robust 3bit/cell Hf0.5Zr0.5O2 Ferroelectric FinFET with High Endurance for Advanced Computing-In-Memory Technology
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De, S.;Lu, D.D.;Le, H.-H.;Mazumder, S.;Lee, Y.-J.;Tseng, W.-C.;Qiu, B.-H.;Baig, Md.A.;Sung, P.-J.;Su, C.-J.;Wu, C.-T.;Wu, Wu W.-F.;Yeh, W.-K.;Wang, Y.-H. |
| 國立成功大學 |
2020 |
Compact model for PZT ferroelectric capacitors with voltage dependent switching behavior
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Wang, C.-W.;Ku, H.;Chiu, Chiu C.Y.;De, S.;Qiu, B.-H.;Shin, C.;Lu, D. |
| 國立成功大學 |
2020 |
Tri-Gate Ferroelectric FET Characterization and Modelling for Online Training of Neural Networks at Room Temperature and 233K
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De, S.;Baig, M.A.;Qiu, B.-H.;Lu, D.;Sung, P.-J.;Hsueh, F.K.;Lee, Y.-J.;Su, C.-J. |
Showing items 1-6 of 6 (1 Page(s) Totally)
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