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Institution Date Title Author
中華大學 2009 Trap Profile and Bias Temperature Instability of ALD-HfSiON Gate Stacks in Advanced MOSFETs 吳建宏; rossiwu
中華大學 2009 Limiting Factors of RF Performance Improvement as Down-scaling to 65-nm Node MOSFETs 吳建宏; rossiwu
中華大學 2009 Design of Low Noise, High Gain and Small Area 0.18um CMOS UWB LNA using New RC-Feedback Topology 吳建宏; rossiwu
中華大學 2009 High Performance ZnO Thin-Film Transistors Using High-k TiHfO Gate Dielectrics 吳建宏; rossiwu
中華大學 2009 A Wideband 0.18um CMOS LNA with RF-Feedback Topology for UWB Application 吳建宏; rossiwu
中華大學 2009 Defect Density Extraction of high-κ Dielectric Gate Stack by Combining Charge Pumping and Low Frequency Measurement 吳建宏; rossiwu

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