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| 國立成功大學 |
2008-09-19 |
Pressure-induced valence anomaly in TmTe probed by resonant inelastic x-ray scattering
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Jarrige, I.; Rueff, J. P.; Shieh, S. R.; Taguchi, M.; Ohishi, Y.; Matsumura, T.; Wang, C. P.; Ishii, H.; Hiraoka, N.; Cai, Y. Q. |
| 國立成功大學 |
2006-05-01 |
f-level occupancy in TmTe under pressure investigated by high-resolution X-ray absorption spectroscopy
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Jarrige, I.; Rueff, J. P.; Shieh, S. R.; Matsumura, T.; Ishii, H.; Hiraoka, N.; Cai, Y. Q. |
| 國立成功大學 |
2005-08 |
Valence state of Tm in TmX (X=S,Se,Te) investigated by resonant inelastic x-ray scattering
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Jarrige, I.; Ishii, H.; Cai, Y. Q.; Rueff, J. P.; Bonnelle, C.; Matsumura, T.; Shieh, Sean R. |
Showing items 1-3 of 3 (1 Page(s) Totally)
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