English  |  正體中文  |  简体中文  |  總筆數 :2875274  
造訪人次 :  54488286    線上人數 :  1668
教育部委託研究計畫      計畫執行:國立臺灣大學圖書館
 
臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
關於TAIR

瀏覽

消息

著作權

相關連結

"ruey shan guo"的相關文件

回到依作者瀏覽
依題名排序 依日期排序

顯示項目 141-190 / 430 (共9頁)
<< < 1 2 3 4 5 6 7 8 9 > >>
每頁顯示[10|25|50]項目

機構 日期 題名 作者
臺大學術典藏 2018-09-10T07:44:16Z Business Network, Knowledge Management Capacity and Innovation Performance: the Social Network Perspective RUEY-SHAN GUO;J. Liu;Y. Wang;C. Chen; RUEY-SHAN GUO; J. Liu; Y. Wang; C. Chen; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:44:16Z The Effects of Supplier’ Use of Power on Cooperation Climate Trust and Buyer’s Commitment D. Chiang; F. Bai; RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO;D. Chiang;F. Bai
臺大學術典藏 2018-09-10T07:44:16Z The Effects of Supplier’ Use of Power on Cooperation Climate Trust and Buyer’s Commitment D. Chiang; F. Bai; RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO;D. Chiang;F. Bai
臺大學術典藏 2018-09-10T07:44:16Z The Effects of Supplier’ Use of Power on Cooperation Climate Trust and Buyer’s Commitment D. Chiang; F. Bai; RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO;D. Chiang;F. Bai
臺大學術典藏 2018-09-10T07:44:16Z Function Decomposition and Cost Modeling for Wafer Manufacturing RUEY-SHAN GUO;A. Chen; RUEY-SHAN GUO; A. Chen; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:44:16Z Function Decomposition and Cost Modeling for Wafer Manufacturing RUEY-SHAN GUO;A. Chen; RUEY-SHAN GUO; A. Chen; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:44:16Z Function Decomposition and Cost Modeling for Wafer Manufacturing RUEY-SHAN GUO;A. Chen; RUEY-SHAN GUO; A. Chen; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:44:15Z 應用層級貝式理論於跨商品類別之顧客購買期間預測模型 RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:44:15Z 應用層級貝式理論於跨商品類別之顧客購買期間預測模型 RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:44:15Z A Multi-Category Inter-purchase Time Model based on Hierarchical Bayesian Theory RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:44:15Z A Multi-Category Inter-purchase Time Model based on Hierarchical Bayesian Theory RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:44:15Z 提昇製程品質控制績效之研究 RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:44:15Z 提昇製程品質控制績效之研究 RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:44:15Z A Self-Tuning Run-by-Run Process Controller for Processes subject to Random Disturbances RUEY-SHAN GUO;S. Lu;A. Chen,;J. Chen;R. Guo; RUEY-SHAN GUO; S. Lu; A. Chen,; J. Chen; R. Guo; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:44:15Z A Self-Tuning Run-by-Run Process Controller for Processes subject to Random Disturbances RUEY-SHAN GUO;S. Lu;A. Chen,;J. Chen;R. Guo; RUEY-SHAN GUO; S. Lu; A. Chen,; J. Chen; R. Guo; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:44:15Z A Self-Tuning Run-by-Run Process Controller for Processes subject to Random Disturbances RUEY-SHAN GUO;S. Lu;A. Chen,;J. Chen;R. Guo; RUEY-SHAN GUO; S. Lu; A. Chen,; J. Chen; R. Guo; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:44:15Z The Final Order Model for Auto Service Parts Considering the End of Product Life Cycle RUEY-SHAN GUO;J. Chen;Y. Chen;D. Chiang; RUEY-SHAN GUO; J. Chen; Y. Chen; D. Chiang; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:44:15Z The Final Order Model for Auto Service Parts Considering the End of Product Life Cycle RUEY-SHAN GUO;J. Chen;Y. Chen;D. Chiang; RUEY-SHAN GUO; J. Chen; Y. Chen; D. Chiang; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:44:15Z The Final Order Model for Auto Service Parts Considering the End of Product Life Cycle RUEY-SHAN GUO;J. Chen;Y. Chen;D. Chiang; RUEY-SHAN GUO; J. Chen; Y. Chen; D. Chiang; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:44:15Z Dynamic Performance Evaluation for Healthcare Service Innovation – A Case Study for PCA Program at NTUH D. Chiang; J. Yu; RUEY-SHAN GUO; RUEY-SHAN GUO;J. Chen;R. Tsao;D. Chiang;J. Yu; RUEY-SHAN GUO; J. Chen; R. Tsao
臺大學術典藏 2018-09-10T07:44:15Z Dynamic Performance Evaluation for Healthcare Service Innovation – A Case Study for PCA Program at NTUH D. Chiang; J. Yu; RUEY-SHAN GUO; RUEY-SHAN GUO;J. Chen;R. Tsao;D. Chiang;J. Yu; RUEY-SHAN GUO; J. Chen; R. Tsao
臺大學術典藏 2018-09-10T07:44:15Z Dynamic Performance Evaluation for Healthcare Service Innovation – A Case Study for PCA Program at NTUH D. Chiang; J. Yu; RUEY-SHAN GUO; RUEY-SHAN GUO;J. Chen;R. Tsao;D. Chiang;J. Yu; RUEY-SHAN GUO; J. Chen; R. Tsao
臺大學術典藏 2018-09-10T07:36:36Z 門診時段及醫師特質對就診流程品質之影響 RUEY-SHAN GUO;FEN-YU TSENG; RUEY-SHAN GUO; FEN-YU TSENG; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:36:36Z 門診時段及醫師特質對就診流程品質之影響 RUEY-SHAN GUO;FEN-YU TSENG; RUEY-SHAN GUO; FEN-YU TSENG; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:36:36Z 門診時段及醫師特質對就診流程品質之影響 RUEY-SHAN GUO;FEN-YU TSENG; RUEY-SHAN GUO; FEN-YU TSENG; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:57Z Forward Echelon-based Inventory Monitoring in Semiconductor Supply Chain MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:57Z Forward Echelon-based Inventory Monitoring in Semiconductor Supply Chain MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:55Z 運用層級式在製存貨控制於半導體供應鏈管理 MING-HUANG CHIANG; RUEY-SHAN GUO; 尝风不; 奖; 法痴秜; MING-HUANG CHIANG; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:55Z 運用層級式在製存貨控制於半導體供應鏈管理 MING-HUANG CHIANG; RUEY-SHAN GUO; 尝风不; 奖; 法痴秜; MING-HUANG CHIANG; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:40Z Self-tuning Process Control for Processes subject to Random Disturbances RUEY-SHAN GUO;A. Chen;J. Chen; RUEY-SHAN GUO; A. Chen; J. Chen; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:40Z Self-tuning Process Control for Processes subject to Random Disturbances RUEY-SHAN GUO;A. Chen;J. Chen; RUEY-SHAN GUO; A. Chen; J. Chen; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:40Z Self-tuning Process Control for Processes subject to Random Disturbances RUEY-SHAN GUO;A. Chen;J. Chen; RUEY-SHAN GUO; A. Chen; J. Chen; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:40Z Virtual Fab: A New Business Model for Service-Oriented Foundry Fab RUEY-SHAN GUO;S. Chang;Y. Su; RUEY-SHAN GUO; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:40Z Virtual Fab: A New Business Model for Service-Oriented Foundry Fab RUEY-SHAN GUO;S. Chang;Y. Su; RUEY-SHAN GUO; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:40Z Virtual Fab: A New Business Model for Service-Oriented Foundry Fab RUEY-SHAN GUO;S. Chang;Y. Su; RUEY-SHAN GUO; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:40Z An Enhanced Algorithm to Integrate Statistical Process Monitoring and Feedback Adjustment RUEY-SHAN GUO;K. Wu;A. Chen; RUEY-SHAN GUO; K. Wu; A. Chen; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:40Z An Enhanced Algorithm to Integrate Statistical Process Monitoring and Feedback Adjustment RUEY-SHAN GUO;K. Wu;A. Chen; RUEY-SHAN GUO; K. Wu; A. Chen; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:40Z An Enhanced Algorithm to Integrate Statistical Process Monitoring and Feedback Adjustment RUEY-SHAN GUO;K. Wu;A. Chen; RUEY-SHAN GUO; K. Wu; A. Chen; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:40Z An Integrated Approach to Semiconductor Equipment Monitoring RUEY-SHAN GUO;A. Yang;A. Chen; RUEY-SHAN GUO; A. Yang; A. Chen; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:40Z An Integrated Approach to Semiconductor Equipment Monitoring RUEY-SHAN GUO;A. Yang;A. Chen; RUEY-SHAN GUO; A. Yang; A. Chen; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:40Z An Integrated Approach to Semiconductor Equipment Monitoring RUEY-SHAN GUO;A. Yang;A. Chen; RUEY-SHAN GUO; A. Yang; A. Chen; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:39Z Statistical Monitoring of Thickness Data Using Bivariate Runs Rules RUEY-SHAN GUO;C. Lee;A. Chen; RUEY-SHAN GUO; C. Lee; A. Chen; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:39Z Statistical Monitoring of Thickness Data Using Bivariate Runs Rules RUEY-SHAN GUO;C. Lee;A. Chen; RUEY-SHAN GUO; C. Lee; A. Chen; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:39Z Statistical Monitoring of Thickness Data Using Bivariate Runs Rules RUEY-SHAN GUO;C. Lee;A. Chen; RUEY-SHAN GUO; C. Lee; A. Chen; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:39Z An Integrated Fault Detection Scheme for Wafer Acceptance Test Data RUEY-SHAN GUO;S. Chang;C. Fan; RUEY-SHAN GUO; S. Chang; C. Fan; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:39Z An Integrated Fault Detection Scheme for Wafer Acceptance Test Data RUEY-SHAN GUO;S. Chang;C. Fan; RUEY-SHAN GUO; S. Chang; C. Fan; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:39Z An Integrated Fault Detection Scheme for Wafer Acceptance Test Data RUEY-SHAN GUO;S. Chang;C. Fan; RUEY-SHAN GUO; S. Chang; C. Fan; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:39Z Runs Rules for Bivariate Shewhart Chart RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:39Z Runs Rules for Bivariate Shewhart Chart RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T07:10:39Z Runs Rules for Bivariate Shewhart Chart RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO

顯示項目 141-190 / 430 (共9頁)
<< < 1 2 3 4 5 6 7 8 9 > >>
每頁顯示[10|25|50]項目