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Showing items 156-205 of 430 (9 Page(s) Totally)
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Institution	Date	Title	Author
臺大學術典藏	2018-09-10T07:44:15Z	A Self-Tuning Run-by-Run Process Controller for Processes subject to Random Disturbances	RUEY-SHAN GUO;S. Lu;A. Chen,;J. Chen;R. Guo; RUEY-SHAN GUO; S. Lu; A. Chen,; J. Chen; R. Guo; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:44:15Z	The Final Order Model for Auto Service Parts Considering the End of Product Life Cycle	RUEY-SHAN GUO;J. Chen;Y. Chen;D. Chiang; RUEY-SHAN GUO; J. Chen; Y. Chen; D. Chiang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:44:15Z	The Final Order Model for Auto Service Parts Considering the End of Product Life Cycle	RUEY-SHAN GUO;J. Chen;Y. Chen;D. Chiang; RUEY-SHAN GUO; J. Chen; Y. Chen; D. Chiang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:44:15Z	The Final Order Model for Auto Service Parts Considering the End of Product Life Cycle	RUEY-SHAN GUO;J. Chen;Y. Chen;D. Chiang; RUEY-SHAN GUO; J. Chen; Y. Chen; D. Chiang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:44:15Z	Dynamic Performance Evaluation for Healthcare Service Innovation – A Case Study for PCA Program at NTUH	D. Chiang; J. Yu; RUEY-SHAN GUO; RUEY-SHAN GUO;J. Chen;R. Tsao;D. Chiang;J. Yu; RUEY-SHAN GUO; J. Chen; R. Tsao
臺大學術典藏	2018-09-10T07:44:15Z	Dynamic Performance Evaluation for Healthcare Service Innovation – A Case Study for PCA Program at NTUH	D. Chiang; J. Yu; RUEY-SHAN GUO; RUEY-SHAN GUO;J. Chen;R. Tsao;D. Chiang;J. Yu; RUEY-SHAN GUO; J. Chen; R. Tsao
臺大學術典藏	2018-09-10T07:44:15Z	Dynamic Performance Evaluation for Healthcare Service Innovation – A Case Study for PCA Program at NTUH	D. Chiang; J. Yu; RUEY-SHAN GUO; RUEY-SHAN GUO;J. Chen;R. Tsao;D. Chiang;J. Yu; RUEY-SHAN GUO; J. Chen; R. Tsao
臺大學術典藏	2018-09-10T07:36:36Z	門診時段及醫師特質對就診流程品質之影響	RUEY-SHAN GUO;FEN-YU TSENG; RUEY-SHAN GUO; FEN-YU TSENG; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:36:36Z	門診時段及醫師特質對就診流程品質之影響	RUEY-SHAN GUO;FEN-YU TSENG; RUEY-SHAN GUO; FEN-YU TSENG; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:36:36Z	門診時段及醫師特質對就診流程品質之影響	RUEY-SHAN GUO;FEN-YU TSENG; RUEY-SHAN GUO; FEN-YU TSENG; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:57Z	Forward Echelon-based Inventory Monitoring in Semiconductor Supply Chain	MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:57Z	Forward Echelon-based Inventory Monitoring in Semiconductor Supply Chain	MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:55Z	運用層級式在製存貨控制於半導體供應鏈管理	MING-HUANG CHIANG; RUEY-SHAN GUO; 尝风不; 奖; 法痴秜; MING-HUANG CHIANG; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:55Z	運用層級式在製存貨控制於半導體供應鏈管理	MING-HUANG CHIANG; RUEY-SHAN GUO; 尝风不; 奖; 法痴秜; MING-HUANG CHIANG; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	Self-tuning Process Control for Processes subject to Random Disturbances	RUEY-SHAN GUO;A. Chen;J. Chen; RUEY-SHAN GUO; A. Chen; J. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	Self-tuning Process Control for Processes subject to Random Disturbances	RUEY-SHAN GUO;A. Chen;J. Chen; RUEY-SHAN GUO; A. Chen; J. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	Self-tuning Process Control for Processes subject to Random Disturbances	RUEY-SHAN GUO;A. Chen;J. Chen; RUEY-SHAN GUO; A. Chen; J. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	Virtual Fab: A New Business Model for Service-Oriented Foundry Fab	RUEY-SHAN GUO;S. Chang;Y. Su; RUEY-SHAN GUO; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	Virtual Fab: A New Business Model for Service-Oriented Foundry Fab	RUEY-SHAN GUO;S. Chang;Y. Su; RUEY-SHAN GUO; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	Virtual Fab: A New Business Model for Service-Oriented Foundry Fab	RUEY-SHAN GUO;S. Chang;Y. Su; RUEY-SHAN GUO; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	An Enhanced Algorithm to Integrate Statistical Process Monitoring and Feedback Adjustment	RUEY-SHAN GUO;K. Wu;A. Chen; RUEY-SHAN GUO; K. Wu; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	An Enhanced Algorithm to Integrate Statistical Process Monitoring and Feedback Adjustment	RUEY-SHAN GUO;K. Wu;A. Chen; RUEY-SHAN GUO; K. Wu; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	An Enhanced Algorithm to Integrate Statistical Process Monitoring and Feedback Adjustment	RUEY-SHAN GUO;K. Wu;A. Chen; RUEY-SHAN GUO; K. Wu; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	An Integrated Approach to Semiconductor Equipment Monitoring	RUEY-SHAN GUO;A. Yang;A. Chen; RUEY-SHAN GUO; A. Yang; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	An Integrated Approach to Semiconductor Equipment Monitoring	RUEY-SHAN GUO;A. Yang;A. Chen; RUEY-SHAN GUO; A. Yang; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:40Z	An Integrated Approach to Semiconductor Equipment Monitoring	RUEY-SHAN GUO;A. Yang;A. Chen; RUEY-SHAN GUO; A. Yang; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	Statistical Monitoring of Thickness Data Using Bivariate Runs Rules	RUEY-SHAN GUO;C. Lee;A. Chen; RUEY-SHAN GUO; C. Lee; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	Statistical Monitoring of Thickness Data Using Bivariate Runs Rules	RUEY-SHAN GUO;C. Lee;A. Chen; RUEY-SHAN GUO; C. Lee; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	Statistical Monitoring of Thickness Data Using Bivariate Runs Rules	RUEY-SHAN GUO;C. Lee;A. Chen; RUEY-SHAN GUO; C. Lee; A. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	An Integrated Fault Detection Scheme for Wafer Acceptance Test Data	RUEY-SHAN GUO;S. Chang;C. Fan; RUEY-SHAN GUO; S. Chang; C. Fan; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	An Integrated Fault Detection Scheme for Wafer Acceptance Test Data	RUEY-SHAN GUO;S. Chang;C. Fan; RUEY-SHAN GUO; S. Chang; C. Fan; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	An Integrated Fault Detection Scheme for Wafer Acceptance Test Data	RUEY-SHAN GUO;S. Chang;C. Fan; RUEY-SHAN GUO; S. Chang; C. Fan; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	Runs Rules for Bivariate Shewhart Chart	RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	Runs Rules for Bivariate Shewhart Chart	RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	Runs Rules for Bivariate Shewhart Chart	RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	A Real-time Equipment Monitoring and Fault Detection System	RUEY-SHAN GUO;C. Tseng;A. Chen;R. Guo; RUEY-SHAN GUO; C. Tseng; A. Chen; R. Guo; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	A Real-time Equipment Monitoring and Fault Detection System	RUEY-SHAN GUO;C. Tseng;A. Chen;R. Guo; RUEY-SHAN GUO; C. Tseng; A. Chen; R. Guo; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:39Z	A Real-time Equipment Monitoring and Fault Detection System	RUEY-SHAN GUO;C. Tseng;A. Chen;R. Guo; RUEY-SHAN GUO; C. Tseng; A. Chen; R. Guo; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	The Effects of Supplier’s Use of Power on Cooperation Climate Inter-firm Trust and Buyer’s Commitment	RUEY-SHAN GUO;F. Pai;D. Chiang; RUEY-SHAN GUO; F. Pai; D. Chiang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	The Effects of Supplier’s Use of Power on Cooperation Climate Inter-firm Trust and Buyer’s Commitment	RUEY-SHAN GUO;F. Pai;D. Chiang; RUEY-SHAN GUO; F. Pai; D. Chiang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	The Effects of Supplier’s Use of Power on Cooperation Climate Inter-firm Trust and Buyer’s Commitment	RUEY-SHAN GUO;F. Pai;D. Chiang; RUEY-SHAN GUO; F. Pai; D. Chiang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Supply Chain Integration and its Determinants	RUEY-SHAN GUO;D. Chiang;F. Pai; RUEY-SHAN GUO; D. Chiang; F. Pai; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Supply Chain Integration and its Determinants	RUEY-SHAN GUO;D. Chiang;F. Pai; RUEY-SHAN GUO; D. Chiang; F. Pai; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Supply Chain Integration and its Determinants	RUEY-SHAN GUO;D. Chiang;F. Pai; RUEY-SHAN GUO; D. Chiang; F. Pai; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Exploratory Study on Emerging Integrator Business Model in Engineering Chain of the Semiconductor Industry: Re-integration of Vertical Disintegration	RUEY-SHAN GUO;D. Kao;C. Lo;Y. Su; RUEY-SHAN GUO; D. Kao; C. Lo; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Exploratory Study on Emerging Integrator Business Model in Engineering Chain of the Semiconductor Industry: Re-integration of Vertical Disintegration	RUEY-SHAN GUO;D. Kao;C. Lo;Y. Su; RUEY-SHAN GUO; D. Kao; C. Lo; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Exploratory Study on Emerging Integrator Business Model in Engineering Chain of the Semiconductor Industry: Re-integration of Vertical Disintegration	RUEY-SHAN GUO;D. Kao;C. Lo;Y. Su; RUEY-SHAN GUO; D. Kao; C. Lo; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Manufacturing Service Creation and Management for Next Generation Virtual Fab	RUEY-SHAN GUO;Y. Lai;T. Chou;S. Chang;Y. Su; RUEY-SHAN GUO; Y. Lai; T. Chou; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Manufacturing Service Creation and Management for Next Generation Virtual Fab	RUEY-SHAN GUO;Y. Lai;T. Chou;S. Chang;Y. Su; RUEY-SHAN GUO; Y. Lai; T. Chou; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T07:10:38Z	Manufacturing Service Creation and Management for Next Generation Virtual Fab	RUEY-SHAN GUO;Y. Lai;T. Chou;S. Chang;Y. Su; RUEY-SHAN GUO; Y. Lai; T. Chou; S. Chang; Y. Su; RUEY-SHAN GUO

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