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显示项目 221-270 / 430 (共9页)
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机构	日期	题名	作者
臺大學術典藏	2018-09-10T06:39:00Z	An Integrated Wafer Acceptance Test Scheme in Semiconductor Manufacturing	RUEY-SHAN GUO;C. Tsai;J. Fan,;S. Chang; RUEY-SHAN GUO; C. Tsai; J. Fan,; S. Chang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	An Integrated Wafer Acceptance Test Scheme in Semiconductor Manufacturing	RUEY-SHAN GUO;C. Tsai;J. Fan,;S. Chang; RUEY-SHAN GUO; C. Tsai; J. Fan,; S. Chang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	An Integrated Wafer Acceptance Test Scheme in Semiconductor Manufacturing	RUEY-SHAN GUO;C. Tsai;J. Fan,;S. Chang; RUEY-SHAN GUO; C. Tsai; J. Fan,; S. Chang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	An Adaptive Process Controller for Semiconductor Manufacturing	RUEY-SHAN GUO;L. Huang;S. Wang;J. Chen; RUEY-SHAN GUO; L. Huang; S. Wang; J. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	An Adaptive Process Controller for Semiconductor Manufacturing	RUEY-SHAN GUO;L. Huang;S. Wang;J. Chen; RUEY-SHAN GUO; L. Huang; S. Wang; J. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	An Adaptive Process Controller for Semiconductor Manufacturing	RUEY-SHAN GUO;L. Huang;S. Wang;J. Chen; RUEY-SHAN GUO; L. Huang; S. Wang; J. Chen; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	Design and Implementation of an Active Furnace Monitoring System in Semiconductor Manufacturing	RUEY-SHAN GUO;S. Chang;C. Tseng;W. Mao; RUEY-SHAN GUO; S. Chang; C. Tseng; W. Mao; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	Design and Implementation of an Active Furnace Monitoring System in Semiconductor Manufacturing	RUEY-SHAN GUO;S. Chang;C. Tseng;W. Mao; RUEY-SHAN GUO; S. Chang; C. Tseng; W. Mao; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	Design and Implementation of an Active Furnace Monitoring System in Semiconductor Manufacturing	RUEY-SHAN GUO;S. Chang;C. Tseng;W. Mao; RUEY-SHAN GUO; S. Chang; C. Tseng; W. Mao; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	生產與作業管理	RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	生產與作業管理	RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:39:00Z	生產與作業管理	RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:59Z	Evolutionary Business Models and Inter-Firm Engineering Processes between the Foundry and Fabless in the Semiconductor Industry	RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:59Z	Evolutionary Business Models and Inter-Firm Engineering Processes between the Foundry and Fabless in the Semiconductor Industry	RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:59Z	Evolutionary Business Models and Inter-Firm Engineering Processes between the Foundry and Fabless in the Semiconductor Industry	RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:59Z	Stochastic Modeling and Validation of Inter-purchase Time for Customer Relationship Management	RUEY-SHAN GUO;J. Chen;Y. Chen,;D. Chiang; RUEY-SHAN GUO; J. Chen; Y. Chen,; D. Chiang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:59Z	Stochastic Modeling and Validation of Inter-purchase Time for Customer Relationship Management	RUEY-SHAN GUO;J. Chen;Y. Chen,;D. Chiang; RUEY-SHAN GUO; J. Chen; Y. Chen,; D. Chiang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:59Z	Stochastic Modeling and Validation of Inter-purchase Time for Customer Relationship Management	RUEY-SHAN GUO;J. Chen;Y. Chen,;D. Chiang; RUEY-SHAN GUO; J. Chen; Y. Chen,; D. Chiang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:59Z	Inter-firm Engineering Processes and Business Models between Foundry and Fabless in Semiconductor Industry,”	RUEY-SHAN GUO;F. Pai;S. Chiu;Y. Su; RUEY-SHAN GUO; F. Pai; S. Chiu; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:59Z	Inter-firm Engineering Processes and Business Models between Foundry and Fabless in Semiconductor Industry,”	RUEY-SHAN GUO;F. Pai;S. Chiu;Y. Su; RUEY-SHAN GUO; F. Pai; S. Chiu; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:59Z	Inter-firm Engineering Processes and Business Models between Foundry and Fabless in Semiconductor Industry,”	RUEY-SHAN GUO;F. Pai;S. Chiu;Y. Su; RUEY-SHAN GUO; F. Pai; S. Chiu; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:59Z	“Cooperative Buyer-Vendor Relationships for Custom Integrated Circuits Manufacturing,”	RUEY-SHAN GUO;D. Chiang;R. Guo,;F. Pai; RUEY-SHAN GUO; D. Chiang; R. Guo,; F. Pai; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:59Z	“Cooperative Buyer-Vendor Relationships for Custom Integrated Circuits Manufacturing,”	RUEY-SHAN GUO;D. Chiang;R. Guo,;F. Pai; RUEY-SHAN GUO; D. Chiang; R. Guo,; F. Pai; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:59Z	“Cooperative Buyer-Vendor Relationships for Custom Integrated Circuits Manufacturing,”	RUEY-SHAN GUO;D. Chiang;R. Guo,;F. Pai; RUEY-SHAN GUO; D. Chiang; R. Guo,; F. Pai; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:59Z	Monitoring and Control of Echelon Inventory in Semiconductor Manufacturing	RUEY-SHAN GUO;D. Chiang; RUEY-SHAN GUO; D. Chiang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:59Z	Monitoring and Control of Echelon Inventory in Semiconductor Manufacturing	RUEY-SHAN GUO;D. Chiang; RUEY-SHAN GUO; D. Chiang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:59Z	Monitoring and Control of Echelon Inventory in Semiconductor Manufacturing	RUEY-SHAN GUO;D. Chiang; RUEY-SHAN GUO; D. Chiang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:58Z	Customer Satisfaction Improvement with a Hybrid Dispatching Rule in Semiconductor Back-end Factories	RUEY-SHAN GUO;D. Chiang;F. Pai; RUEY-SHAN GUO; D. Chiang; F. Pai; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:58Z	Customer Satisfaction Improvement with a Hybrid Dispatching Rule in Semiconductor Back-end Factories	RUEY-SHAN GUO;D. Chiang;F. Pai; RUEY-SHAN GUO; D. Chiang; F. Pai; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:38:58Z	Customer Satisfaction Improvement with a Hybrid Dispatching Rule in Semiconductor Back-end Factories	RUEY-SHAN GUO;D. Chiang;F. Pai; RUEY-SHAN GUO; D. Chiang; F. Pai; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:34Z	Design of Supply Chain Contract by Consideration of Risk Pooling and Risk Sharing	Ruey-Shan Guo;David M. Chiang;Hung-Jen Lo;Fan-Yun Pai; Ruey-Shan Guo; David M. Chiang; Hung-Jen Lo; Fan-Yun Pai; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:04:34Z	Design of Supply Chain Contract by Consideration of Risk Pooling and Risk Sharing	Ruey-Shan Guo;David M. Chiang;Hung-Jen Lo;Fan-Yun Pai; Ruey-Shan Guo; David M. Chiang; Hung-Jen Lo; Fan-Yun Pai; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:04:34Z	Take-Or-Pay Supply Chain Contract under Market Price Volatility	David M. Chiang;Ruey-Shan Guo;Ming-Hsien Chen;Fan-Yun Pai; David M. Chiang; Ruey-Shan Guo; Ming-Hsien Chen; Fan-Yun Pai; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:04:34Z	Take-Or-Pay Supply Chain Contract under Market Price Volatility	David M. Chiang;Ruey-Shan Guo;Ming-Hsien Chen;Fan-Yun Pai; David M. Chiang; Ruey-Shan Guo; Ming-Hsien Chen; Fan-Yun Pai; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:04:34Z	Sensitivity Analysis of a Quadratic Goal Programming Model for Semiconductor Supply Chain	David M. Chiang;Ruey-Shan Guo;Argon Chen;Cheng-Bang Chen; David M. Chiang; Ruey-Shan Guo; Argon Chen; Cheng-Bang Chen; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:04:34Z	Sensitivity Analysis of a Quadratic Goal Programming Model for Semiconductor Supply Chain	David M. Chiang;Ruey-Shan Guo;Argon Chen;Cheng-Bang Chen; David M. Chiang; Ruey-Shan Guo; Argon Chen; Cheng-Bang Chen; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:04:34Z	Supply Chain CONWIP Inventory Control in Semiconductor Manufacturing	Ruey-Shan Guo;David Chiang; Ruey-Shan Guo; David Chiang; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:04:34Z	Supply Chain CONWIP Inventory Control in Semiconductor Manufacturing	Ruey-Shan Guo;David Chiang; Ruey-Shan Guo; David Chiang; MING-HUANG CHIANG
臺大學術典藏	2018-09-10T06:04:18Z	Intelligent IC Fabrication Diagnosis System	RUEY-SHAN GUO;S. Chang,;J. Lee;C. Tsai;R. Gu; RUEY-SHAN GUO; S. Chang,; J. Lee; C. Tsai; R. Gu; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:18Z	Intelligent IC Fabrication Diagnosis System	RUEY-SHAN GUO;S. Chang,;J. Lee;C. Tsai;R. Gu; RUEY-SHAN GUO; S. Chang,; J. Lee; C. Tsai; R. Gu; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:18Z	Intelligent IC Fabrication Diagnosis System	RUEY-SHAN GUO;S. Chang,;J. Lee;C. Tsai;R. Gu; RUEY-SHAN GUO; S. Chang,; J. Lee; C. Tsai; R. Gu; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:18Z	End-of-line Quality Control and Abnormal Trend Detection for IC Fabrication	RUEY-SHAN GUO;J. Lee;S. Chang;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; J. Fan; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:18Z	End-of-line Quality Control and Abnormal Trend Detection for IC Fabrication	RUEY-SHAN GUO;J. Lee;S. Chang;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; J. Fan; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:18Z	End-of-line Quality Control and Abnormal Trend Detection for IC Fabrication	RUEY-SHAN GUO;J. Lee;S. Chang;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; J. Fan; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:18Z	Fuzzy Logic-based Process Diagnosis Using Water Acceptance Test Data	RUEY-SHAN GUO;S. Chang;J. Lee;C. Tsai; RUEY-SHAN GUO; S. Chang; J. Lee; C. Tsai; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:18Z	Fuzzy Logic-based Process Diagnosis Using Water Acceptance Test Data	RUEY-SHAN GUO;S. Chang;J. Lee;C. Tsai; RUEY-SHAN GUO; S. Chang; J. Lee; C. Tsai; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:18Z	Fuzzy Logic-based Process Diagnosis Using Water Acceptance Test Data	RUEY-SHAN GUO;S. Chang;J. Lee;C. Tsai; RUEY-SHAN GUO; S. Chang; J. Lee; C. Tsai; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:18Z	Abnormal Trend Detection of End-of-line Data Using EWMA Chart	RUEY-SHAN GUO;J. Lee;S. Chang;R. Guo;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; R. Guo; J. Fan; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:18Z	Abnormal Trend Detection of End-of-line Data Using EWMA Chart	RUEY-SHAN GUO;J. Lee;S. Chang;R. Guo;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; R. Guo; J. Fan; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:18Z	Abnormal Trend Detection of End-of-line Data Using EWMA Chart	RUEY-SHAN GUO;J. Lee;S. Chang;R. Guo;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; R. Guo; J. Fan; RUEY-SHAN GUO

显示项目 221-270 / 430 (共9页)
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