| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Stochastic Modeling and Validation of Inter-purchase Time for Customer Relationship Management
|
RUEY-SHAN GUO;J. Chen;Y. Chen,;D. Chiang; RUEY-SHAN GUO; J. Chen; Y. Chen,; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Stochastic Modeling and Validation of Inter-purchase Time for Customer Relationship Management
|
RUEY-SHAN GUO;J. Chen;Y. Chen,;D. Chiang; RUEY-SHAN GUO; J. Chen; Y. Chen,; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Stochastic Modeling and Validation of Inter-purchase Time for Customer Relationship Management
|
RUEY-SHAN GUO;J. Chen;Y. Chen,;D. Chiang; RUEY-SHAN GUO; J. Chen; Y. Chen,; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Inter-firm Engineering Processes and Business Models between Foundry and Fabless in Semiconductor Industry,”
|
RUEY-SHAN GUO;F. Pai;S. Chiu;Y. Su; RUEY-SHAN GUO; F. Pai; S. Chiu; Y. Su; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Inter-firm Engineering Processes and Business Models between Foundry and Fabless in Semiconductor Industry,”
|
RUEY-SHAN GUO;F. Pai;S. Chiu;Y. Su; RUEY-SHAN GUO; F. Pai; S. Chiu; Y. Su; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Inter-firm Engineering Processes and Business Models between Foundry and Fabless in Semiconductor Industry,”
|
RUEY-SHAN GUO;F. Pai;S. Chiu;Y. Su; RUEY-SHAN GUO; F. Pai; S. Chiu; Y. Su; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
“Cooperative Buyer-Vendor Relationships for Custom Integrated Circuits Manufacturing,”
|
RUEY-SHAN GUO;D. Chiang;R. Guo,;F. Pai; RUEY-SHAN GUO; D. Chiang; R. Guo,; F. Pai; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
“Cooperative Buyer-Vendor Relationships for Custom Integrated Circuits Manufacturing,”
|
RUEY-SHAN GUO;D. Chiang;R. Guo,;F. Pai; RUEY-SHAN GUO; D. Chiang; R. Guo,; F. Pai; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
“Cooperative Buyer-Vendor Relationships for Custom Integrated Circuits Manufacturing,”
|
RUEY-SHAN GUO;D. Chiang;R. Guo,;F. Pai; RUEY-SHAN GUO; D. Chiang; R. Guo,; F. Pai; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Monitoring and Control of Echelon Inventory in Semiconductor Manufacturing
|
RUEY-SHAN GUO;D. Chiang; RUEY-SHAN GUO; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Monitoring and Control of Echelon Inventory in Semiconductor Manufacturing
|
RUEY-SHAN GUO;D. Chiang; RUEY-SHAN GUO; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:59Z |
Monitoring and Control of Echelon Inventory in Semiconductor Manufacturing
|
RUEY-SHAN GUO;D. Chiang; RUEY-SHAN GUO; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:58Z |
Customer Satisfaction Improvement with a Hybrid Dispatching Rule in Semiconductor Back-end Factories
|
RUEY-SHAN GUO;D. Chiang;F. Pai; RUEY-SHAN GUO; D. Chiang; F. Pai; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:58Z |
Customer Satisfaction Improvement with a Hybrid Dispatching Rule in Semiconductor Back-end Factories
|
RUEY-SHAN GUO;D. Chiang;F. Pai; RUEY-SHAN GUO; D. Chiang; F. Pai; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:38:58Z |
Customer Satisfaction Improvement with a Hybrid Dispatching Rule in Semiconductor Back-end Factories
|
RUEY-SHAN GUO;D. Chiang;F. Pai; RUEY-SHAN GUO; D. Chiang; F. Pai; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Design of Supply Chain Contract by Consideration of Risk Pooling and Risk Sharing
|
Ruey-Shan Guo;David M. Chiang;Hung-Jen Lo;Fan-Yun Pai; Ruey-Shan Guo; David M. Chiang; Hung-Jen Lo; Fan-Yun Pai; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Design of Supply Chain Contract by Consideration of Risk Pooling and Risk Sharing
|
Ruey-Shan Guo;David M. Chiang;Hung-Jen Lo;Fan-Yun Pai; Ruey-Shan Guo; David M. Chiang; Hung-Jen Lo; Fan-Yun Pai; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Take-Or-Pay Supply Chain Contract under Market Price Volatility
|
David M. Chiang;Ruey-Shan Guo;Ming-Hsien Chen;Fan-Yun Pai; David M. Chiang; Ruey-Shan Guo; Ming-Hsien Chen; Fan-Yun Pai; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Take-Or-Pay Supply Chain Contract under Market Price Volatility
|
David M. Chiang;Ruey-Shan Guo;Ming-Hsien Chen;Fan-Yun Pai; David M. Chiang; Ruey-Shan Guo; Ming-Hsien Chen; Fan-Yun Pai; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Sensitivity Analysis of a Quadratic Goal Programming Model for Semiconductor Supply Chain
|
David M. Chiang;Ruey-Shan Guo;Argon Chen;Cheng-Bang Chen; David M. Chiang; Ruey-Shan Guo; Argon Chen; Cheng-Bang Chen; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Sensitivity Analysis of a Quadratic Goal Programming Model for Semiconductor Supply Chain
|
David M. Chiang;Ruey-Shan Guo;Argon Chen;Cheng-Bang Chen; David M. Chiang; Ruey-Shan Guo; Argon Chen; Cheng-Bang Chen; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Supply Chain CONWIP Inventory Control in Semiconductor Manufacturing
|
Ruey-Shan Guo;David Chiang; Ruey-Shan Guo; David Chiang; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:04:34Z |
Supply Chain CONWIP Inventory Control in Semiconductor Manufacturing
|
Ruey-Shan Guo;David Chiang; Ruey-Shan Guo; David Chiang; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T06:04:18Z |
Intelligent IC Fabrication Diagnosis System
|
RUEY-SHAN GUO;S. Chang,;J. Lee;C. Tsai;R. Gu; RUEY-SHAN GUO; S. Chang,; J. Lee; C. Tsai; R. Gu; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:18Z |
Intelligent IC Fabrication Diagnosis System
|
RUEY-SHAN GUO;S. Chang,;J. Lee;C. Tsai;R. Gu; RUEY-SHAN GUO; S. Chang,; J. Lee; C. Tsai; R. Gu; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:18Z |
Intelligent IC Fabrication Diagnosis System
|
RUEY-SHAN GUO;S. Chang,;J. Lee;C. Tsai;R. Gu; RUEY-SHAN GUO; S. Chang,; J. Lee; C. Tsai; R. Gu; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:18Z |
End-of-line Quality Control and Abnormal Trend Detection for IC Fabrication
|
RUEY-SHAN GUO;J. Lee;S. Chang;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; J. Fan; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:18Z |
End-of-line Quality Control and Abnormal Trend Detection for IC Fabrication
|
RUEY-SHAN GUO;J. Lee;S. Chang;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; J. Fan; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:18Z |
End-of-line Quality Control and Abnormal Trend Detection for IC Fabrication
|
RUEY-SHAN GUO;J. Lee;S. Chang;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; J. Fan; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:18Z |
Fuzzy Logic-based Process Diagnosis Using Water Acceptance Test Data
|
RUEY-SHAN GUO;S. Chang;J. Lee;C. Tsai; RUEY-SHAN GUO; S. Chang; J. Lee; C. Tsai; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:18Z |
Fuzzy Logic-based Process Diagnosis Using Water Acceptance Test Data
|
RUEY-SHAN GUO;S. Chang;J. Lee;C. Tsai; RUEY-SHAN GUO; S. Chang; J. Lee; C. Tsai; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:18Z |
Fuzzy Logic-based Process Diagnosis Using Water Acceptance Test Data
|
RUEY-SHAN GUO;S. Chang;J. Lee;C. Tsai; RUEY-SHAN GUO; S. Chang; J. Lee; C. Tsai; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:18Z |
Abnormal Trend Detection of End-of-line Data Using EWMA Chart
|
RUEY-SHAN GUO;J. Lee;S. Chang;R. Guo;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; R. Guo; J. Fan; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:18Z |
Abnormal Trend Detection of End-of-line Data Using EWMA Chart
|
RUEY-SHAN GUO;J. Lee;S. Chang;R. Guo;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; R. Guo; J. Fan; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:18Z |
Abnormal Trend Detection of End-of-line Data Using EWMA Chart
|
RUEY-SHAN GUO;J. Lee;S. Chang;R. Guo;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; R. Guo; J. Fan; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:17Z |
Supply Chain Inventory Control in Semiconductor Manufacturing
|
MING-HUANG CHIANG; RUEY-SHAN GUO; R. Guo; D. Chiang; L. Yang; K. Chuang; MING-HUANG CHIANG; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:17Z |
Supply Chain Inventory Control in Semiconductor Manufacturing
|
MING-HUANG CHIANG; RUEY-SHAN GUO; R. Guo; D. Chiang; L. Yang; K. Chuang; MING-HUANG CHIANG; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:17Z |
A Quadratic Goal Programming Model and Sensitivity Analysis for Semiconductor Supply Chain
|
MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:17Z |
A Quadratic Goal Programming Model and Sensitivity Analysis for Semiconductor Supply Chain
|
MING-HUANG CHIANG; RUEY-SHAN GUO; MING-HUANG CHIANG; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:17Z |
Evolutionary Engineering Collaboration for DFM/DFY Solutions between Foundry and EDA Tools Vendors: A Preliminary Exploration
|
RUEY-SHAN GUO;H. Chang;Y. Su; RUEY-SHAN GUO; H. Chang; Y. Su; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:17Z |
Evolutionary Engineering Collaboration for DFM/DFY Solutions between Foundry and EDA Tools Vendors: A Preliminary Exploration
|
RUEY-SHAN GUO;H. Chang;Y. Su; RUEY-SHAN GUO; H. Chang; Y. Su; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:17Z |
Evolutionary Engineering Collaboration for DFM/DFY Solutions between Foundry and EDA Tools Vendors: A Preliminary Exploration
|
RUEY-SHAN GUO;H. Chang;Y. Su; RUEY-SHAN GUO; H. Chang; Y. Su; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:17Z |
The Design of Supply Chain Contract in Consideration of Risk Pooling and Risk Sharing
|
RUEY-SHAN GUO;F. Pai;H. Lo,;D. Chiang;R. Guo; RUEY-SHAN GUO; F. Pai; H. Lo,; D. Chiang; R. Guo; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:17Z |
The Design of Supply Chain Contract in Consideration of Risk Pooling and Risk Sharing
|
RUEY-SHAN GUO;F. Pai;H. Lo,;D. Chiang;R. Guo; RUEY-SHAN GUO; F. Pai; H. Lo,; D. Chiang; R. Guo; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:17Z |
The Design of Supply Chain Contract in Consideration of Risk Pooling and Risk Sharing
|
RUEY-SHAN GUO;F. Pai;H. Lo,;D. Chiang;R. Guo; RUEY-SHAN GUO; F. Pai; H. Lo,; D. Chiang; R. Guo; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:17Z |
Abnormal Trend Detection of Sequence-disordered Data Using EWMA Method
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:17Z |
Abnormal Trend Detection of Sequence-disordered Data Using EWMA Method
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:17Z |
Abnormal Trend Detection of Sequence-disordered Data Using EWMA Method
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:16Z |
供應鏈雙佔結構下的品質與價格競爭
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T06:04:16Z |
供應鏈雙佔結構下的品質與價格競爭
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
