| 臺大學術典藏 |
2018-09-10T04:36:38Z |
Agile Semiconductor Manufacturing System: From Job Shop to Work Cell
|
RUEY-SHAN GUO;K. Holman;M. Slama;R. Griffin; RUEY-SHAN GUO; K. Holman; M. Slama; R. Griffin; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:36:38Z |
Agile Semiconductor Manufacturing System: From Job Shop to Work Cell
|
RUEY-SHAN GUO;K. Holman;M. Slama;R. Griffin; RUEY-SHAN GUO; K. Holman; M. Slama; R. Griffin; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:36:38Z |
Agile Semiconductor Manufacturing System: From Job Shop to Work Cell
|
RUEY-SHAN GUO;K. Holman;M. Slama;R. Griffin; RUEY-SHAN GUO; K. Holman; M. Slama; R. Griffin; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:36:38Z |
A Work Cell Manufacturing System for VLSI Fabrication
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:36:38Z |
A Work Cell Manufacturing System for VLSI Fabrication
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:36:38Z |
A Work Cell Manufacturing System for VLSI Fabrication
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:36:38Z |
The Use of Qbd as a Method for Evaluating Gate Oxide Cleaning Splits
|
RUEY-SHAN GUO;S. Geha;M. Slama; RUEY-SHAN GUO; S. Geha; M. Slama; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:36:38Z |
The Use of Qbd as a Method for Evaluating Gate Oxide Cleaning Splits
|
RUEY-SHAN GUO;S. Geha;M. Slama; RUEY-SHAN GUO; S. Geha; M. Slama; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:36:38Z |
The Use of Qbd as a Method for Evaluating Gate Oxide Cleaning Splits
|
RUEY-SHAN GUO;S. Geha;M. Slama; RUEY-SHAN GUO; S. Geha; M. Slama; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:36:37Z |
Modeling, Optimization and Control of Spatial Uniformity in Manufacturing Processes
|
RUEY-SHAN GUO;E. Sachs; RUEY-SHAN GUO; E. Sachs; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:36:37Z |
Modeling, Optimization and Control of Spatial Uniformity in Manufacturing Processes
|
RUEY-SHAN GUO;E. Sachs; RUEY-SHAN GUO; E. Sachs; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:36:37Z |
Modeling, Optimization and Control of Spatial Uniformity in Manufacturing Processes
|
RUEY-SHAN GUO;E. Sachs; RUEY-SHAN GUO; E. Sachs; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:16:31Z |
Coordinated Multi-Plant Production Planning in a Multi-Echelon Production Environment
|
Ji-Chyuan Liu;David M. Chiang;Ruey-Shan Guo; Ji-Chyuan Liu; David M. Chiang; Ruey-Shan Guo; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T04:16:31Z |
Coordinated Multi-Plant Production Planning in a Multi-Echelon Production Environment
|
Ji-Chyuan Liu;David M. Chiang;Ruey-Shan Guo; Ji-Chyuan Liu; David M. Chiang; Ruey-Shan Guo; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T04:16:31Z |
Using Decomposition Method to Solve Multi-Plant Production Planning and Scheduling Problem
|
David M. Chiang;Ruey-Shan Guo;Meng-Ching Lee; David M. Chiang; Ruey-Shan Guo; Meng-Ching Lee; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T04:16:31Z |
Using Decomposition Method to Solve Multi-Plant Production Planning and Scheduling Problem
|
David M. Chiang;Ruey-Shan Guo;Meng-Ching Lee; David M. Chiang; Ruey-Shan Guo; Meng-Ching Lee; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T04:16:30Z |
Optimization-Based Available-to-Promise Allocation Model
|
Ruey-Shan Guo;David M. Chiang;Jen-Yi Chen; Ruey-Shan Guo; David M. Chiang; Jen-Yi Chen; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T04:16:30Z |
Optimization-Based Available-to-Promise Allocation Model
|
Ruey-Shan Guo;David M. Chiang;Jen-Yi Chen; Ruey-Shan Guo; David M. Chiang; Jen-Yi Chen; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T04:16:30Z |
A Component Commonality-Based Material Planning Model for the Assembly Industry
|
David M. Chiang;Ruey-Shan Guo;Ming-Hsin Yu; David M. Chiang; Ruey-Shan Guo; Ming-Hsin Yu; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T04:16:30Z |
A Component Commonality-Based Material Planning Model for the Assembly Industry
|
David M. Chiang;Ruey-Shan Guo;Ming-Hsin Yu; David M. Chiang; Ruey-Shan Guo; Ming-Hsin Yu; MING-HUANG CHIANG |
| 臺大學術典藏 |
2018-09-10T04:16:20Z |
An Optimized Gate Oxide Breakdown Test by Activating Oxide Traps at Low Fields
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:16:20Z |
An Optimized Gate Oxide Breakdown Test by Activating Oxide Traps at Low Fields
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:16:20Z |
An Optimized Gate Oxide Breakdown Test by Activating Oxide Traps at Low Fields
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:16:20Z |
生產管理個案教材
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:16:20Z |
生產管理個案教材
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:16:20Z |
生產管理個案教材
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:16:19Z |
Optimization-based Available-to-Promise Allocation Model
|
RUEY-SHAN GUO;J. Chen;D. Chiang; RUEY-SHAN GUO; J. Chen; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:16:19Z |
Optimization-based Available-to-Promise Allocation Model
|
RUEY-SHAN GUO;J. Chen;D. Chiang; RUEY-SHAN GUO; J. Chen; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:16:19Z |
Optimization-based Available-to-Promise Allocation Model
|
RUEY-SHAN GUO;J. Chen;D. Chiang; RUEY-SHAN GUO; J. Chen; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:16:19Z |
A Component Commonality-based Material Planning Model for the Assembly Industry
|
Ruey-Shan Guo; M. Yu; D. Chiang; RUEY-SHAN GUO; M. Yu; D. Chiang |
| 臺大學術典藏 |
2018-09-10T04:16:19Z |
A Component Commonality-based Material Planning Model for the Assembly Industry
|
Ruey-Shan Guo; M. Yu; D. Chiang; RUEY-SHAN GUO; M. Yu; D. Chiang |
| 臺大學術典藏 |
2018-09-10T04:16:19Z |
Using Decomposition Method to Solve Multi-Plant Production Planning and Scheduling Problem
|
RUEY-SHAN GUO;M. Lee;R. Guo;D. Chiang; RUEY-SHAN GUO; M. Lee; R. Guo; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:16:19Z |
Using Decomposition Method to Solve Multi-Plant Production Planning and Scheduling Problem
|
RUEY-SHAN GUO;M. Lee;R. Guo;D. Chiang; RUEY-SHAN GUO; M. Lee; R. Guo; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:16:19Z |
Using Decomposition Method to Solve Multi-Plant Production Planning and Scheduling Problem
|
RUEY-SHAN GUO;M. Lee;R. Guo;D. Chiang; RUEY-SHAN GUO; M. Lee; R. Guo; D. Chiang; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:16:19Z |
Data Mining Techniques for Engineering Data Analysis: Issues and Solutions
|
RUEY-SHAN GUO;M. King;J. Wei;L. Hu;O. Ho;A. Hon;C. Fan;A. Chen; RUEY-SHAN GUO; M. King; J. Wei; L. Hu; O. Ho; A. Hon; C. Fan; A. Chen; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:16:19Z |
Data Mining Techniques for Engineering Data Analysis: Issues and Solutions
|
RUEY-SHAN GUO;M. King;J. Wei;L. Hu;O. Ho;A. Hon;C. Fan;A. Chen; RUEY-SHAN GUO; M. King; J. Wei; L. Hu; O. Ho; A. Hon; C. Fan; A. Chen; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T04:16:19Z |
Data Mining Techniques for Engineering Data Analysis: Issues and Solutions
|
RUEY-SHAN GUO;M. King;J. Wei;L. Hu;O. Ho;A. Hon;C. Fan;A. Chen; RUEY-SHAN GUO; M. King; J. Wei; L. Hu; O. Ho; A. Hon; C. Fan; A. Chen; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T03:51:25Z |
Control System for VLSI Fabrication
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T03:51:25Z |
Control System for VLSI Fabrication
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T03:51:25Z |
Control System for VLSI Fabrication
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T03:51:25Z |
Data Mining and Fault Diagnosis based on Wafer Acceptance Test Data
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T03:51:25Z |
Data Mining and Fault Diagnosis based on Wafer Acceptance Test Data
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018-09-10T03:51:25Z |
Data Mining and Fault Diagnosis based on Wafer Acceptance Test Data
|
RUEY-SHAN GUO; RUEY-SHAN GUO; RUEY-SHAN GUO |
| 臺大學術典藏 |
2018 |
The strategic choice for applying government subsidized RD: The relationship among organizational resources and capabilities, strategy, and performance
|
Chen C.-J.;Guo R.-S.;Hsiao Y.-C.;Hu K.-K.; Chen C.-J.; Guo R.-S.; Hsiao Y.-C.; Hu K.-K.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2013-02 |
Partner Selection Model for Design Chain Collaboration
|
J. Chen; D. Chiang; R. Guo; MING-HUANG CHIANG; RUEY-SHAN GUO |
| 臺大學術典藏 |
2010-12 |
Partner Selection Model for Green Design
|
RUEY-SHAN GUO; D. Chiang,; J. Chen; RUEY-SHAN GUO; RUEY-SHAN GUO;D. Chiang,;J. Chen |
| 臺大學術典藏 |
2010-12 |
Partner Selection Model for Green Design
|
RUEY-SHAN GUO; D. Chiang,; J. Chen; RUEY-SHAN GUO; RUEY-SHAN GUO;D. Chiang,;J. Chen |
| 臺大學術典藏 |
2010-12 |
Partner Selection Model for Green Design
|
RUEY-SHAN GUO; D. Chiang,; J. Chen; RUEY-SHAN GUO; RUEY-SHAN GUO;D. Chiang,;J. Chen |
| 臺大學術典藏 |
2008 |
Exploratory study on emerging integrator business model in engineering chain of the semiconductor industry: Re-integration of vertical disintegration
|
Su Y.-H.;Guo R.-S.;Lo C.-W.;Kao D.-X.; Su Y.-H.; Guo R.-S.; Lo C.-W.; Kao D.-X.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2006-12 |
Monitoring Semiconductor Supply Chain based on Echelon WIP Inventory and CONWIP System
|
D. Chiang; RUEY-SHAN GUO; L. Yang; RUEY-SHAN GUO; RUEY-SHAN GUO;L. Yang;D. Chiang |