臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
臺大學術典藏	2020-03-06T03:42:38Z	Data mining and fault diagnosis based on wafer acceptance test data and in-line manufacturing data	Fan C.-M.;Guo R.-S.;Chen A.;Hsu K.-C.;Wei C.-S.; Fan C.-M.; Guo R.-S.; Chen A.; Hsu K.-C.; Wei C.-S.; RUEY-SHAN GUO
臺大學術典藏	2020-03-06T03:42:37Z	A real-time equipment monitoring and fault detection system	Guo R.S.;Chen A.;Tseng C.L.;Fong I.K.;Yang A.;Lee C.L.;Wu C.H.;Lin S.;Huang S.J.;Lee Y.C.;Chang S.G.;Lee M.Y.; Guo R.S.; Chen A.; Tseng C.L.; Fong I.K.; Yang A.; Lee C.L.; Wu C.H.; Lin S.; Huang S.J.; Lee Y.C.; Chang S.G.; Lee M.Y.; RUEY-SHAN GUO
臺大學術典藏	2020-03-06T03:42:37Z	Age-based double EWMA controller and its application to CMP processes	Chen A.;Guo R.-S.; Chen A.; Guo R.-S.; RUEY-SHAN GUO
臺大學術典藏	2020-03-06T03:42:37Z	Agile Flow Control in Semiconductor Manufacturing: Simulation and Animation Demonstration	Guo R.-S.;Griffin R.;Slama M.; Guo R.-S.; Griffin R.; Slama M.; RUEY-SHAN GUO
臺大學術典藏	2020-03-06T03:42:37Z	An effective SPC approach to monitoring semiconductor quality data with multiple variation sources	Chen A.;Guo R.-S.;Yeh P.-C.; Chen A.; Guo R.-S.; Yeh P.-C.; RUEY-SHAN GUO
臺大學術典藏	2020-03-06T03:42:37Z	A self-tuning run-by-run process controller for processes subject to random disturbances	Guo R.-S.;Chen J.-J.;Chen A.;Lu S.-S.; Guo R.-S.; Chen J.-J.; Chen A.; Lu S.-S.; RUEY-SHAN GUO
臺大學術典藏	2020-03-06T03:42:36Z	A conceptual framework for manufacturing service provisioning by virtual fabs	Su Y.-H.;Guo R.-S.;Chang S.-C.; Su Y.-H.; Guo R.-S.; Chang S.-C.; RUEY-SHAN GUO
臺大學術典藏	2020-03-06T03:42:36Z	A dynamic binding model for service creation in virtual fab	Chang S.C.;Chou T.-L.;Guo R.-S.;Su Y.-H.;Lu L.-L.;Lai I.-C.; Chang S.C.; Chou T.-L.; Guo R.-S.; Su Y.-H.; Lu L.-L.; Lai I.-C.; RUEY-SHAN GUO
臺大學術典藏	2020-03-06T03:42:36Z	A multi-category inter-purchase time model based on hierarchical Bayesian theory	RUEY-SHAN GUO
臺大學術典藏	2020-03-06T03:42:25Z	A WIP-based exception-management model for integrated circuit back-end production processes	RUEY-SHAN GUO; MING-HUANG CHIANG; Pai F.-Y.; MING-HUANG CHIANG

Showing items 41-50 of 430 (43 Page(s) Totally)
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