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Institution	Date	Title	Author
臺大學術典藏	2018-09-10T09:22:35Z	4H-SiC wafers studied by X-ray absorption and Raman scattering	Xu, Q.; CHEE-WEE LIU et al.; Sun, H.Y.; Chen, C.; Jang, L.-Y.; Rusli; Mendis, S.P.; Tin, C.C.; Qiu, Z.R.; Wu, Z.; Liu, C.W.; Feng, Z.C.

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