English  |  正體中文  |  简体中文  |  2830311  
???header.visitor??? :  32525504    ???header.onlineuser??? :  716
???header.sponsordeclaration???
 
臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
???ui.leftmenu.abouttair???

???ui.leftmenu.bartitle???

???index.news???

???ui.leftmenu.copyrighttitle???

???ui.leftmenu.link???

"ryzhkov v"???jsp.browse.items-by-author.description???

???jsp.browse.items-by-author.back???
???jsp.browse.items-by-author.order1??? ???jsp.browse.items-by-author.order2???

Showing items 1-1 of 1  (1 Page(s) Totally)
1 
View [10|25|50] records per page

Institution Date Title Author
國立交通大學 2014-12-08T15:25:15Z Direct experimental evidence of the hole capture by resonant levels in boron doped silicon Yen, ST; Tulupenko, V; Cheng, ES; Dalakyan, A; Lee, CP; Chao, KA; Belykh, V; Abramov, A; Ryzhkov, V

Showing items 1-1 of 1  (1 Page(s) Totally)
1 
View [10|25|50] records per page