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Institution Date Title Author
南台科技大學 2003 In situ control of SiOx composition by spectroscopic ellipsometry 高至誠; B. Gallas; C.-C. Kao; S. Fission; G. Vuye; J. Rivory
南台科技大學 2003 Photoluminescence study of erbium doped SiO2 thin films containing Si nanocrystals 高至誠; C.-C. Kao; C. Bartou; B. Gallas; S. Fission; G. Vuye; J. Rivory
南台科技大學 2003 In situ control of SiOx stoechiometry by spectroscopic ellipsometry 高至誠; B. Gallas; C.-C. Kao; S. Fission; G. Vuye; J. Rivory
南台科技大學 2003 Dielectric function of Si dots embedded in SiO2 高至誠; B. Gallas; C.-C. Kao; C. Defranoux; S. Fission; G. Vuye; J. Rivory
南台科技大學 2003 Photoluminescence study of SiO2 thin films doped with Si nano-grains and erbium 高至誠; C.-C. Kao; C. Bartou; B. Gallas; S. Fission; G. Vuye; J. Rivory
南台科技大學 2002 Laser annealing of SiOx thin films 高至誠; B. Gallas; C.-C. Kao; S. Fission; G. Vuye; J. Rivory; Y. Bernard; C. Belouet

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