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Institution Date Title Author
臺大學術典藏 2018-09-10T06:02:16Z Analysis of Fringing Electric Field Related Capacitance Behavior of Narrow-Channel FD SOI NMOS Devices Using 3D Simulation C. C. Chen; J. B. Kuo; K. W. Su; S. Liu; JAMES-B KUO
臺大學術典藏 2018-09-10T06:02:15Z Partitioned gate tunnelling current model considering distributed effect for CMOS devices with ultra-thin (1 nm) gate oxide C. H. Lin; J. B. KUO; K. W. Su; S. Liu; JAMES-B KUO
臺大學術典藏 2018-09-10T06:02:15Z Analysis of the gate-source/drain capacitance behavior of a narrow-channel FD SOINMOS device considering the 3-D fringing capacitances using 3-D simulation C. C. Chen; J. B. Kuo; K. W. Su,; S. Liu; JAMES-B KUO
國立中山大學 2004-03 Study of Thermal and Heat Transfer Phenomenon in Friction Stir Welding of Aluminum Alloy 6061-T6 Thick Plates S. Liu; Y.J. Chao; C.H. Chien

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