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Institution	Date	Title	Author
國立中山大學	2004	Relationships among equivalent oxide thickness, nanochemistry, and nanostructure in atomic layer chemical-vapor-deposited Hf-O films on Si	S.K. Dey;A. Das;M. Tsai;D. Gu;M. Floyd;R.W. Carpenter;H. De Waard;C. Werkhoven;S. Marcus

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	造訪人次 : 50702134 線上人數 : 337 教育部委託研究計畫計畫執行:國立臺灣大學圖書館