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Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立臺灣大學 |
2003 |
Critical angle for irreversible switching of the exchange-bias direction in NiO-Cu-Ni81Fe19 films
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Haas, O. de; Sch?fer, R.; Schultz, L.; Schneider, C. M.; Chang, Y. M.; Lin, M.-T. |
國立臺灣大學 |
2002 |
Magnetic domain imaging of exchange bias system NiO/Cu/NiFe by Kerr microscopy
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Chang, Y. M.; Lin, Minn-Tsong; Pan, W.; Ho, C. H.; Yao, Y. D.; Haas, O. de; Sch?fer, R.; Schneider, C. M. |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
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