|
English
|
正體中文
|
简体中文
|
2823515
|
|
???header.visitor??? :
30388691
???header.onlineuser??? :
1116
???header.sponsordeclaration???
|
|
|
???tair.name??? >
???browser.page.title.author???
|
"see yc"???jsp.browse.items-by-author.description???
Showing items 1-4 of 4 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立交通大學 |
2014-12-08T15:43:06Z |
Novel chip standby current prediction model and ultrathin gate oxide scaling limit
|
Su, HD; Chiou, BS; Lu, PC; Chang, MH; Lee, KH; Chao, CP; See, YC; Sung, JYC |
國立交通大學 |
2014-12-08T15:40:51Z |
A floating well method for exact capacitance-voltage measurement of nano technology
|
Su, HD; Chiou, BS; Wu, SY; Chang, MH; Lee, KH; Chen, YS; Chao, CP; See, YC; Sun, JYC |
國立交通大學 |
2014-12-08T15:40:26Z |
Characteristics of oxide breakdown and related impact on device of ultrathin (2.2 nm) silicon dioxide
|
Su, HD; Chiou, BS; Wu, SY; Chang, MH; Lee, KH; Chen, YS; Cha, CP; See, YC; Sun, JYC |
國立交通大學 |
2014-12-08T15:40:05Z |
Bi-mode breakdown test methodology of ultrathin oxide
|
Su, HD; Chiou, BS; Ko, CY; Wu, SY; Chang, MH; Lee, KH; Chen, YS; Chao, CP; See, YC; Sun, JYC |
Showing items 1-4 of 4 (1 Page(s) Totally) 1 View [10|25|50] records per page
|