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Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
| 國立成功大學 |
2024 |
Insight into Latchup Risk in 28nm Planar Bulk Technology for Quantum Computing Applications
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Serbulova;K;Qiu;Z, -E.;Chen;S, -H.;Grill;A;Kao;K, -H.;Boeck, de;J;Groeseneken;G |
| 國立成功大學 |
2024 |
ESD Robustness of Germanium Photodetectors in Advanced Silicon Photonics Technology
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Chen;S, -H.;Fu;P, -Y.;Tsiara;A;Peer, van de;M;Simicic;M;Musibau;S;Ban;Y;Kao;K, -H.;Chen;W, -C.;Serbulova;K;Campenhout, Van;J;Absil;P;Croes;K |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
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