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"shelke a r"的相關文件
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| 臺大學術典藏 |
2022-08-09T03:50:07Z |
Bandgap Shrinkage and Charge Transfer in 2D Layered SnS2 Doped with V for Photocatalytic Efficiency Improvement
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Shelke A.R.; Wang H.-T.; Chiou J.-W.; Shown I.; Sabbah A.; Chen K.-H.; Teng S.-A.; Lin I.-A.; Lee C.-C.; Hsueh H.-C.; Liang Y.-H.; Du C.-H.; Yadav P.L.; Ray S.C.; Hsieh S.-H.; Pao C.-W.; Tsai H.-M.; Chen C.-H.; Chen K.-H.; Chen L.-C.; Pong W.-F.; Shelke A.R.; Chen K.-H.; Chen L.-C.; LI-CHYONG CHEN |
| 淡江大學 |
2022-01-13 |
Bandgap Shrinkage and Charge Transfer in 2D Layered SnS2 Doped with V for Photocatalytic Efficiency Improvement
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Shelke, A. R.;Wang, H. T.;Chiou, J. W.;Chen, K. H.;Teng, S. A.;Lin, I. A.;Lee, C. C.;Hsueh, H. C.;Liang, Y. H.;Du, C. H.;Yadav, P. L.;Ray, S. C.;Hsieh, S. H.;Pao, C.W.;Tsai, H. M.;Shown, I.;Sabbah, A.;Chen, K. H.;Chen, L. C.;Pong, W. F. |
| 淡江大學 |
2021/08/26 |
Role of interfacial defects in photoelectrochemical properties of BiVO4 coated on ZnO nanodendrites: x-ray spectroscopic and microscopic investigation
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Wang, H. T.;Chiou*, J. W.;Chen, K. H.;Shelke, A. R.;Dong*, C. L.;Lai, C. H.;Yeh, P. H.;Du, C. H.;Lai, C. Y.;Asokan, K.;Hsieh, S. H.;Shiu, H. W.;Pao, C. W.;Tsai, H. M.;Yang, J. S.;Wu, J. J.;Ohigashi, T.;Pong*, and W. F. |
| 淡江大學 |
2021-08-26 |
Role of Interfacial Defects in Photoelectrochemical Properties of BiVO4 Coated on ZnO Nanodendrites: X-ray Spectroscopic and Microscopic Investigation
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Shelke, A. R.;Wang, H. T.;Chiou, J. W.;Chen, K. H.;Teng, S. A.;Lin, I. A.;Lee, C. C.;Hsueh, H. C.;Liang, Y. H.;Du, C. H.;Yadav, P. L.;Ray, S. C.;Hsieh, S. H.;PaoWang, C.W.;Hsiao-Tsu;Chiou, Jau-Wern;Chen, Kuan-Hung;Shelke, Abhijeet R.;Dong, Chung-Li;Lai, Chun-Hao;Yeh, Ping-Hung;Du, Chao-Hung;Lai, Chun-Yen;Asokan, Kandasami;Hsieh, Shang-Hsien;Shiu, Hung Wei;Pao, Chih-Wen;Tsai, Huang-Ming;Yang, Jih-Sheng;Wu, Jih-Jen;Ohigashi, Takuji;Pong, Way-Faung |
| 國立成功大學 |
2021 |
Role of Interfacial Defects in Photoelectrochemical Properties of BiVO4Coated on ZnO Nanodendrites: X-ray Spectroscopic and Microscopic Investigation
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Wang, H.-T.;Chiou, J.-W.;Chen, K.-H.;Shelke, A.R.;Dong, C.-L.;Lai, C.-H.;Yeh, P.-H.;Du, C.-H.;Lai, C.-Y.;Asokan, K.;Hsieh, S.-H.;Shiu, H.-W.;Pao, C.-W.;Tsai, H.-M.;Yang, J.-S.;Wu, J.-J.;Ohigashi, T.;Pong, W.-F. |
| 國立臺灣科技大學 |
2016 |
Contact angle measurements: A preliminary diagnostic tool for evaluating the performance of ZnFe2O4 nano-flake based supercapacitors
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Vadiyar, M.M;Bhise, S.C;Patil, S.K;Kolekar, S.S;Shelke, A.R;Deshpande, N.G;Chang, J.-Y;Ghule, K.S;Ghule, A.V. |
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