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Institution Date Title Author
義守大學 2008/08/20 Dynamic scanning method to clarify the mechanism of WLCSP package reliability issue Po-Ying Chen ; Chwei-Shyong Tsai ; Ming-Hsiung Tsai ; Heng-Yu Kung ; Shen-Li Chen ; Jing, M.H. ; Wen-Kuan Yeh
義守大學 2008-10 Elucidating the effects of current stress history on reliability characteristics by dynamic analysis Po-Ying Chen;Shen-Li Chen;Ming-Hsiung Tsai;Wen-Kuan Yeh;Heng-Yu Kung;YuKon Chang
義守大學 2007/07/11 The Defects of Silicon Reacted with Carbon Content Vapour in ULSI Nano-meter-Generation Technology Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C. ; Cheng-Chia Kuo
義守大學 2007/07/11 The Defects of Silicon Reacted with Carbon Content Vapour in ULSI Nano-meter-Generation Technology Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C. ; Cheng-Chia Kuo
義守大學 2007/07/11 The Failure Mode Investigation of Barrier Layer TaN Combined with Al Pad Architecture using in Cu Process Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C.

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