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Showing items 1-4 of 4 (1 Page(s) Totally)
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| 國立交通大學 |
2018-08-21T05:57:09Z |
ESD-Induced Latchup-Like Failure in a Touch Panel Control IC
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Ker, Ming-Dou; Chiu, Po-Yen; Shieh, Wuu-Trong; Wang, Chun-Chi |
| 國立交通大學 |
2017-04-21T06:56:36Z |
ESD Protection Design for Touch Panel Control IC Against Latchup-Like Failure Induced by System-Level ESD Test
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Ker, Ming-Dou; Chiu, Po-Yen; Shieh, Wuu-Trong; Wang, Chun-Chi |
| 國立交通大學 |
2014-12-08T15:37:32Z |
Electrostatic Discharge Protection Design for High-Voltage Programming Pin in Fully-Silicided CMOS ICs
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Ker, Ming-Dou; Chen, Wen-Yi; Shieh, Wuu-Trong; Wei, I-Ju |
| 國立交通大學 |
2014-12-08T15:08:06Z |
New Ballasting Layout Schemes to Improve ESD Robustness of I/O Buffers in Fully Silicided CMOS Process
|
Ker, Ming-Dou; Chen, Wen-Yi; Shieh, Wuu-Trong; Wei, I-Ju |
Showing items 1-4 of 4 (1 Page(s) Totally)
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