臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Showing items 1-8 of 8 (1 Page(s) Totally)
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Institution	Date	Title	Author
臺大學術典藏	2019-10-24T08:24:33Z	DR-scan: Dual-rail Asynchronous Scan DfT and ATPG	CHIEN-MO LI;James Chien-Mo Li;Chia-Cheng Pai Tsai-Chieh Chen;Kuan-Yen Huang;Ting-Yu Shen;Ying-Hsu Wang;Shih-An Hsieh; Shih-An Hsieh; Ying-Hsu Wang; Ting-Yu Shen; Kuan-Yen Huang; Chia-Cheng Pai Tsai-Chieh Chen; James Chien-Mo Li; CHIEN-MO LI
臺大學術典藏	2019-10-24T08:24:33Z	DR-scan: Dual-rail Asynchronous Scan DfT and ATPG	CHIEN-MO LI;James Chien-Mo Li;Chia-Cheng Pai Tsai-Chieh Chen;Kuan-Yen Huang;Ting-Yu Shen;Ying-Hsu Wang;Shih-An Hsieh; Shih-An Hsieh; Ying-Hsu Wang; Ting-Yu Shen; Kuan-Yen Huang; Chia-Cheng Pai Tsai-Chieh Chen; James Chien-Mo Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T15:26:16Z	DR Scan: DR-scan: A Test Methodology for Dual-rail Asynchronous Circuit	Shih-An. Hsieh;Y.-H.Wang;K.Y. Huang;James C.M Li; Shih-An. Hsieh; Y.-H.Wang; K.Y. Huang; James C.M Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T15:26:16Z	DR Scan: DR-scan: A Test Methodology for Dual-rail Asynchronous Circuit	Shih-An. Hsieh;Y.-H.Wang;K.Y. Huang;James C.M Li; Shih-An. Hsieh; Y.-H.Wang; K.Y. Huang; James C.M Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:50:54Z	Testing Leakage Faults of Power TSV in 3D IC	Chi-Jih Shih;Shih-An Hsieh;Yi-Chang Lu;James Chien-Mo Li;Tzong-Lin Wu;K. Chakrabarty; Chi-Jih Shih; Shih-An Hsieh; Yi-Chang Lu; James Chien-Mo Li; Tzong-Lin Wu; K. Chakrabarty; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:50:54Z	Testing Leakage Faults of Power TSV in 3D IC	Chi-Jih Shih;Shih-An Hsieh;Yi-Chang Lu;James Chien-Mo Li;Tzong-Lin Wu;K. Chakrabarty; Chi-Jih Shih; Shih-An Hsieh; Yi-Chang Lu; James Chien-Mo Li; Tzong-Lin Wu; K. Chakrabarty; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:50:54Z	Test Generation of Path Delay Faults Induced by Defects in Power TSV	Chi-Jih Shih;Shih-An Hsieh;Yi-Chang Lu;James Chien-Mo Li;Tzong-Lin Wu;K. Chakrabarty; Chi-Jih Shih; Shih-An Hsieh; Yi-Chang Lu; James Chien-Mo Li; Tzong-Lin Wu; K. Chakrabarty; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:50:54Z	Test Generation of Path Delay Faults Induced by Defects in Power TSV	Chi-Jih Shih;Shih-An Hsieh;Yi-Chang Lu;James Chien-Mo Li;Tzong-Lin Wu;K. Chakrabarty; Chi-Jih Shih; Shih-An Hsieh; Yi-Chang Lu; James Chien-Mo Li; Tzong-Lin Wu; K. Chakrabarty; CHIEN-MO LI

Showing items 1-8 of 8 (1 Page(s) Totally)
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